Energy of low angle grain boundaries based on continuum dislocation structure
In this paper, we present a continuum model to compute the energy of low angle grain boundaries for any given degrees of freedom (arbitrary rotation axis, rotation angle and boundary plane orientation) based on a continuum dislocation structure. In our continuum model, we minimize the grain boundary...
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Main Authors | , , |
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Format | Journal Article |
Language | English |
Published |
13.10.2016
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Subjects | |
Online Access | Get full text |
DOI | 10.48550/arxiv.1610.04318 |
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Summary: | In this paper, we present a continuum model to compute the energy of low
angle grain boundaries for any given degrees of freedom (arbitrary rotation
axis, rotation angle and boundary plane orientation) based on a continuum
dislocation structure. In our continuum model, we minimize the grain boundary
energy associated with the dislocation structure subject to the constraint of
Frank's formula for dislocations with all possible Burgers vectors. This
constrained minimization problem is solved by the penalty method by which it is
turned into an unconstrained minimization problem. The grain boundary
dislocation structure is approximated by a network of straight dislocations
that predicts the energy and dislocation densities of the grain boundaries. The
grain boundary energy based on the calculated dislocation structure is able to
incorporate its anisotropic nature. We use our continuum model to
systematically study the energy of $ $ low angle grain boundaries in fcc Al
with any boundary plane orientation and all six possible Burgers vectors.
Comparisons with results of the atomistic simulations show that our continuum
model is able to give excellent predictions of the energy and dislocation
densities of low angle grain boundaries. We also study the energy of low angle
grain boundaries in fcc Al with varying rotation axis while the rest degrees of
freedom are fixed. With minor modifications, our model can also apply to
dislocation structures and energy of heterogeneous interfaces. |
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DOI: | 10.48550/arxiv.1610.04318 |