Atomic Super-Resolution Tomography
We consider the problem of reconstructing a nanocrystal at atomic resolution from electron microscopy images taken at a few tilt angles. A popular reconstruction approach called discrete tomography confines the atom locations to a coarse spatial grid, which is inspired by the physical a priori knowl...
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| Published in | Combinatorial Image Analysis Vol. 12148; pp. 45 - 61 |
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| Main Authors | , , , |
| Format | Book Chapter |
| Language | English |
| Published |
Switzerland
Springer International Publishing AG
2020
Springer International Publishing |
| Series | Lecture Notes in Computer Science |
| Subjects | |
| Online Access | Get full text |
| ISBN | 9783030510015 3030510018 |
| ISSN | 0302-9743 1611-3349 |
| DOI | 10.1007/978-3-030-51002-2_4 |
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| Summary: | We consider the problem of reconstructing a nanocrystal at atomic resolution from electron microscopy images taken at a few tilt angles. A popular reconstruction approach called discrete tomography confines the atom locations to a coarse spatial grid, which is inspired by the physical a priori knowledge that atoms in a crystalline solid tend to form regular lattices. Although this constraint has proven to be powerful for solving this very under-determined inverse problem in many cases, its key limitation is that, in practice, defects may occur that cause atoms to deviate from regular lattice positions. Here we propose a grid-free discrete tomography algorithm that allows for continuous deviations of the atom locations similar to super-resolution approaches for microscopy. The new formulation allows us to define atomic interaction potentials explicitly, which results in a both meaningful and powerful incorporation of the available physical a priori knowledge about the crystal’s properties. In computational experiments, we compare the proposed grid-free method to established grid-based approaches and show that our approach can indeed recover the atom positions more accurately for common lattice defects. |
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| ISBN: | 9783030510015 3030510018 |
| ISSN: | 0302-9743 1611-3349 |
| DOI: | 10.1007/978-3-030-51002-2_4 |