Atomic Super-Resolution Tomography

We consider the problem of reconstructing a nanocrystal at atomic resolution from electron microscopy images taken at a few tilt angles. A popular reconstruction approach called discrete tomography confines the atom locations to a coarse spatial grid, which is inspired by the physical a priori knowl...

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Bibliographic Details
Published inCombinatorial Image Analysis Vol. 12148; pp. 45 - 61
Main Authors Ganguly, Poulami Somanya, Lucka, Felix, Hupkes, Hermen Jan, Batenburg, Kees Joost
Format Book Chapter
LanguageEnglish
Published Switzerland Springer International Publishing AG 2020
Springer International Publishing
SeriesLecture Notes in Computer Science
Subjects
Online AccessGet full text
ISBN9783030510015
3030510018
ISSN0302-9743
1611-3349
DOI10.1007/978-3-030-51002-2_4

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Summary:We consider the problem of reconstructing a nanocrystal at atomic resolution from electron microscopy images taken at a few tilt angles. A popular reconstruction approach called discrete tomography confines the atom locations to a coarse spatial grid, which is inspired by the physical a priori knowledge that atoms in a crystalline solid tend to form regular lattices. Although this constraint has proven to be powerful for solving this very under-determined inverse problem in many cases, its key limitation is that, in practice, defects may occur that cause atoms to deviate from regular lattice positions. Here we propose a grid-free discrete tomography algorithm that allows for continuous deviations of the atom locations similar to super-resolution approaches for microscopy. The new formulation allows us to define atomic interaction potentials explicitly, which results in a both meaningful and powerful incorporation of the available physical a priori knowledge about the crystal’s properties. In computational experiments, we compare the proposed grid-free method to established grid-based approaches and show that our approach can indeed recover the atom positions more accurately for common lattice defects.
ISBN:9783030510015
3030510018
ISSN:0302-9743
1611-3349
DOI:10.1007/978-3-030-51002-2_4