Notch sensitivity and defect sensitivity under fatigue loading : Two sides of the same medal

Notch sensitivity and defect sensitivity are two different aspects of the fatigue behavior of materials. This paper extends the Kitagawa diagram to blunt cracks (U-shaped notches) and presents the simple expression (a*/a(0)) exp 0.5 = K(t). In such an expression a(0) is the El-Haddad length paramete...

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Published inInternational journal of fracture Vol. 107; no. 1; pp. L3 - L8
Main Authors ATZORI, Bruno, LAZZARIN, Paolo
Format Journal Article
LanguageEnglish
Published Heidelberg Springer 2001
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ISSN0376-9429

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Summary:Notch sensitivity and defect sensitivity are two different aspects of the fatigue behavior of materials. This paper extends the Kitagawa diagram to blunt cracks (U-shaped notches) and presents the simple expression (a*/a(0)) exp 0.5 = K(t). In such an expression a(0) is the El-Haddad length parameter, and a* is a particular blunt crack depth corresponding to the intersection between the delta-K(th) and delta-sigma(0)/K(t) curves. The new expression provides an explicit bridging between the notch sensitivity and the sensitivity to defects. (Author)
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ISSN:0376-9429