광픽업 유닛 기반 원자현미경의 Dynamic 모드 측정용 Lock-in Amplifier

In this paper, we introduce a lock-in amplifier for the dynamic mode operation of atomic force microscopy, based on the optical pickup unit of a DVD. We fabricated a lock-in amplifier, which is fundamentally based on the principle of the dual phase mode, and included an additional enhancement struct...

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Bibliographic Details
Published in한국생산제조학회지 Vol. 28; no. 2; pp. 132 - 138
Main Authors Mark A. Cruz, 송수환(Su-Hwan Song), 이상헌(Sang Heon Lee)
Format Journal Article
LanguageKorean
Published 한국생산제조학회 01.04.2019
Subjects
기계공학
Dynamic imaging mode
Atomic force microscopy
Scanning probe microscopy
Lock-in amplifier
Displacement sensor
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ISSN2508-5093
2508-5107
DOI10.7735/ksmte.2019.28.2.132

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Summary:In this paper, we introduce a lock-in amplifier for the dynamic mode operation of atomic force microscopy, based on the optical pickup unit of a DVD. We fabricated a lock-in amplifier, which is fundamentally based on the principle of the dual phase mode, and included an additional enhancement structure to ensure high bandwidth, so that it is capable of supporting high-speed scanning probe microcopy in the future. We performed a basic experiment for performance evaluation and dynamic mode imaging of a standard sample by applying the fabricated lock-in amplifier module to a pre-developed optical pickup unit based atomic force microscopy. KCI Citation Count: 0
ISSN:2508-5093
2508-5107
DOI:10.7735/ksmte.2019.28.2.132