2007 IEEE Conference on Computer Vision and Pattern Recognition : 17-22 June, 2007, Minneapolis, MN

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Bibliographic Details
Main Authors IEEE Conference on Computer Vision and Pattern Recognition, Baker, Simon, Matas, Jiri, Zabih, Ramin, Kanada, Takeo, Medioni, Gerard
Format Book
LanguageEnglish
Published Piscataway, N.J IEEE Service Center 2007
Online AccessGet full text
ISBN9781424411795
1424411793

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Bibliography:"IEEE catalog number 07CH37898"--T.p. verso
Includes bibliographical references
Index: p. A1-A12
ISBN:9781424411795
1424411793