RF 마그네트론 스퍼터링 법으로 제작한 ITZO 박막의 구조 및 광학적 특성

Indium tin zinc oxide (ITZO) thin films were deposited on glass and quartz substrates by RF magnetron sputtering. The substrate temperature varied from $100^{\circ}C$ to $400^{\circ}C$. The structural and optical properties of thin films were investigated by X-ray diffraction (XRD), Field Emission S...

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Published inBiuletyn Uniejowski Vol. 48; no. 6; pp. 292 - 296
Main Authors 김동렬(Dong Ryeol Kim), 배지환(Ji Hwan Bae), 황동현(Dong Hyun Hwang), 손영국(Young Guk Son)
Format Journal Article
LanguageKorean
Published 한국표면공학회 2015
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ISSN1225-8024
2299-8403
2288-8403
DOI10.5695/JKISE.2015.48.6.292

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Abstract Indium tin zinc oxide (ITZO) thin films were deposited on glass and quartz substrates by RF magnetron sputtering. The substrate temperature varied from $100^{\circ}C$ to $400^{\circ}C$. The structural and optical properties of thin films were investigated by X-ray diffraction (XRD), Field Emission Scanning electron microscopy (FESEM) and UV-Visible transmission spectra. It has been found from X-ray diffraction patterns that increasing the substrate temperature, the amorphous structure changes into polycrystalline structure. The FESEM results showed that all ITZO thin films have a smooth surface. The average optical transmittance (400 - 800 nm) was 82% and 80% at all films deposited at $200^{\circ}C$. The band gap energy ranges 3.41 to 3.57eV and 2.81 to 3.44eV with a maximum value at $200^{\circ}C$ all substrates temperature.
AbstractList Indium tin zinc oxide (ITZO) thin films were deposited on glass and quartz substrates by RF magnetron sputtering. The substrate temperature varied from 100oC to 400oC. The structural and optical properties of thin films were investigated by X-ray diffraction (XRD), Field Emission Scanning electron microscopy (FESEM) and UV-Visible transmission spectra. It has been found from X-ray diffraction patterns that increasing the substrate temperature, the amorphous structure changes into polycrystalline structure. The FESEM results showed that all ITZO thin films have a smooth surface. The average optical transmittance (400 - 800 nm) was 82% and 80% at all films deposited at 200oC. The band gap energy ranges 3.41 to 3.57eV and 2.81 to 3.44eV with a maximum value at 200oC all substrates temperature. KCI Citation Count: 0
Indium tin zinc oxide (ITZO) thin films were deposited on glass and quartz substrates by RF magnetron sputtering. The substrate temperature varied from $100^{\circ}C$ to $400^{\circ}C$. The structural and optical properties of thin films were investigated by X-ray diffraction (XRD), Field Emission Scanning electron microscopy (FESEM) and UV-Visible transmission spectra. It has been found from X-ray diffraction patterns that increasing the substrate temperature, the amorphous structure changes into polycrystalline structure. The FESEM results showed that all ITZO thin films have a smooth surface. The average optical transmittance (400 - 800 nm) was 82% and 80% at all films deposited at $200^{\circ}C$. The band gap energy ranges 3.41 to 3.57eV and 2.81 to 3.44eV with a maximum value at $200^{\circ}C$ all substrates temperature.
Author 황동현(Dong Hyun Hwang)
김동렬(Dong Ryeol Kim)
배지환(Ji Hwan Bae)
손영국(Young Guk Son)
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Title RF 마그네트론 스퍼터링 법으로 제작한 ITZO 박막의 구조 및 광학적 특성
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