온도측정에 의한 SPD용 배리스터의 성능평가에 관한 연구(Ⅰ)

• Published in: 전기학회 논문지 P권, 58(4) Vol. 58; no. 4; pp. 490 - 494
• Main Authors: 여인식(In-Sik Yeo), 고영민(Young-Min Ko), 이기식(Ki-Sik Lee)
• Format: Journal Article
• Language: Korean
• Published: 대한전기학회 2009
• Subjects: 전기공학; Varistor; Temperature; Surge-Current; DC-Leakage-Current; SPD
• ISSN: 1229-800X; 2586-7792

In this paper, how the temperature of a varistor changes when $10/350{\mu}s$ surge currents and/or DC leakage currents are applied on it, respectively, are investigated. The temperature change in varistor is related with injection energy and leakage current. which is the integration of power in time. By the surge current test, we found that the temperature jump is proportional to the level of surge current with slant 52.535 and has no relation with the ambient temperature. And by the DC leakage current test, the difference in temperatures between varistor and ambient is proportional to the magnitude of leakage current. The slope of measured line(the temperature difference vs. the leakage current) shows alteration around $100{\mu}A$. The varistors can not be used more than $100{\mu}A$ region any more. From the above experimental results, we can conclude that data of the surge current test and also those of DC leakage current test can predict the performance of varistors of which the surge protective devices are made.