CCD 잔존영상 분석

For an image sensor CCD, electrons can be trapped at the front-side Si-SiO$_2$ surface interface in a case of exceeding the full well by bright source. Residual images can be made by the electrons remaining in the interface. These residual images are seen in the front-side-illuminated CCDs especiall...

Full description

Saved in:
Bibliographic Details
Published inJournal of astronomy and space sciences Vol. 22; no. 4; pp. 483 - 490
Main Authors 진호, 이충욱, 김승리, 강용범, 구재림, 한원용, Jin, Ho, Lee, C.U, Kim, S.L, Kang, Y.B, Goo, J.L, Han, W
Format Journal Article
LanguageKorean
Published 한국우주과학회 01.12.2005
Subjects
천문학
analysis
CCD
residual image
Online AccessGet full text
ISSN2093-5587
2093-1409

Cover

More Information
Summary:For an image sensor CCD, electrons can be trapped at the front-side Si-SiO$_2$ surface interface in a case of exceeding the full well by bright source. Residual images can be made by the electrons remaining in the interface. These residual images are seen in the front-side-illuminated CCDs especially. It is not easy to find a quantitative analysis for this phenomenon in the domestic reports, although it is able to contaminate observation data. In this study, we find residual images in dark frames which were obtained from the front-side-illuminated CCD at Mt. Lemmon Optical Astronomy Observatory (LOAO), and analyze the effect to contaminated observation data by residual charges. KCI Citation Count: 0
Bibliography:G704-000106.2005.22.4.001
ISSN:2093-5587
2093-1409