APA (7th ed.) Citation

Jin, T., Gao, S., Ding, H., & Xia, H. (2021). Reliability analysis for the fractional-order circuit system subject to the uncertain random fractional-order model with Caputo type. Journal of Advanced Research, 32, 15-26. https://doi.org/10.1016/j.jare.2021.04.008

Chicago Style (17th ed.) Citation

Jin, Ting, Shangce Gao, Hui Ding, and Hongxuan Xia. "Reliability Analysis for the Fractional-order Circuit System Subject to the Uncertain Random Fractional-order Model with Caputo Type." Journal of Advanced Research 32 (2021): 15-26. https://doi.org/10.1016/j.jare.2021.04.008.

MLA (9th ed.) Citation

Jin, Ting, et al. "Reliability Analysis for the Fractional-order Circuit System Subject to the Uncertain Random Fractional-order Model with Caputo Type." Journal of Advanced Research, vol. 32, 2021, pp. 15-26, https://doi.org/10.1016/j.jare.2021.04.008.