Reliability analysis for the fractional-order circuit system subject to the uncertain random fractional-order model with Caputo type

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Bibliographic Details
Published inJournal of Advanced Research Vol. 32; pp. 15 - 26
Main Authors Ting Jin, Shangce Gao, Hui Ding, Hongxuan Xia
Format Journal Article
LanguageJapanese
Published Elsevier BV 01.09.2021
Subjects
Chance theory
Degradation process
External shock
Fractional differential equation
Medicine (General)
Q1-390
R5-920
Reliability analysis
Science (General)
Uncertainty theory
Online AccessGet full text
ISSN2090-1232
DOI10.1016/j.jare.2021.04.008

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ISSN:2090-1232
DOI:10.1016/j.jare.2021.04.008