透過型電子顕微鏡（TEM）によるセラミックス材料の微構造観察と解析
Microstructural observation using transmission electron microscopy (TEM) is a promising technique for obtaining new findings with atomic-scale and developing phenomenological theory for ceramic materials. This paper reports on observation techniques and diverse findings obtained by observations of s...
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| Published in | Funtai Kogakkaishi Vol. 54; no. 4; pp. 224 - 230 |
|---|---|
| Main Author | |
| Format | Journal Article |
| Language | Japanese |
| Published |
Kyoto
一般社団法人 粉体工学会
01.01.2017
Japan Science and Technology Agency |
| Subjects | |
| Online Access | Get full text |
| ISSN | 0386-6157 1883-7239 |
| DOI | 10.4164/sptj.54.224 |
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| Abstract | Microstructural observation using transmission electron microscopy (TEM) is a promising technique for obtaining new findings with atomic-scale and developing phenomenological theory for ceramic materials. This paper reports on observation techniques and diverse findings obtained by observations of several ceramics. The knowledge obtained here is expected to be useful in the design of future materials. |
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| AbstractList | Microstructural observation using transmission electron microscopy (TEM) is a promising technique for obtaining new findings with atomic-scale and developing phenomenological theory for ceramic materials. This paper reports on observation techniques and diverse findings obtained by observations of several ceramics. The knowledge obtained here is expected to be useful in the design of future materials. |
| Author | 中野, 裕美 |
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| SubjectTerms | Ceramic Ceramics Crystal structure Electrons Microstructure SAED pattern TEM Transmission electron microscopy |
| Title | 透過型電子顕微鏡（TEM）によるセラミックス材料の微構造観察と解析 |
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