透過型電子顕微鏡（TEM）によるセラミックス材料の微構造観察と解析

Microstructural observation using transmission electron microscopy (TEM) is a promising technique for obtaining new findings with atomic-scale and developing phenomenological theory for ceramic materials. This paper reports on observation techniques and diverse findings obtained by observations of s...

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Bibliographic Details
Published inFuntai Kogakkaishi Vol. 54; no. 4; pp. 224 - 230
Main Author 中野, 裕美
Format Journal Article
LanguageJapanese
Published Kyoto 一般社団法人 粉体工学会 01.01.2017
Japan Science and Technology Agency
Subjects
Ceramic
Ceramics
Crystal structure
Electrons
Microstructure
SAED pattern
TEM
Transmission electron microscopy
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ISSN0386-6157
1883-7239
DOI10.4164/sptj.54.224

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Summary:Microstructural observation using transmission electron microscopy (TEM) is a promising technique for obtaining new findings with atomic-scale and developing phenomenological theory for ceramic materials. This paper reports on observation techniques and diverse findings obtained by observations of several ceramics. The knowledge obtained here is expected to be useful in the design of future materials.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
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ISSN:0386-6157
1883-7239
DOI:10.4164/sptj.54.224