ACO based embedded system testing using UML Activity Diagram

This paper proposed a model-based technique for test scenario generation using Activity Diagram (AD). We transform an AD specification into an intermediate graph called Activity Interaction Graph (AIG) using the proposed parser. After that, we apply combination of BFS and DFS algorithms for generati...

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Bibliographic Details
Published inTENCON ... IEEE Region Ten Conference pp. 237 - 242
Main Authors Panthi, Vikas, Mohapatra, Durga Prasad
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.11.2016
Subjects
Ant colony optimization
Cellular phones
Embedded systems
Software testing
Unified modeling language
Online AccessGet full text
ISSN2159-3450
DOI10.1109/TENCON.2016.7847997

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Summary:This paper proposed a model-based technique for test scenario generation using Activity Diagram (AD). We transform an AD specification into an intermediate graph called Activity Interaction Graph (AIG) using the proposed parser. After that, we apply combination of BFS and DFS algorithms for generating test scenarios. Then, we apply an algorithm called ACOToTSP (Ant Colony Optimization for Test Scenarios Prioritization) algorithm on the generated test scenarios with respect to some decision and concurrent criteria, for prioritizing the test scenarios. This approach generates test scenarios according to forks, Joins, and merge point's strength in the activity diagram.
ISSN:2159-3450
DOI:10.1109/TENCON.2016.7847997