Failure Mode and Lifetime Analysis of 9×× nm High Power Broad Stripe Laser Diodes

Reliability of InGaAs/AlGaAs high power broad stripe laser diodes (LDs) are governed by random mode of sudden failure as far as being operated under practical condition of temperature and output power. In this work, wear-out failure mode determining absolute lifetime of LDs are studied in terms of f...

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Bibliographic Details
Published inConference digest - IEEE International Semiconductor Laser Conference pp. 1 - 2
Main Authors Yamagata, Y., Sato, S., Yamada, Y., Yamaguchi, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2018
Subjects
Aging
AlGaAs
COMD
Degradation
Diode lasers
failure mode
high power laser
InGaAs
Laser excitation
lifetime
Pump lasers
Reliability
Semiconductor lasers
wear-out
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ISSN1947-6981
DOI10.1109/ISLC.2018.8516252

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Summary:Reliability of InGaAs/AlGaAs high power broad stripe laser diodes (LDs) are governed by random mode of sudden failure as far as being operated under practical condition of temperature and output power. In this work, wear-out failure mode determining absolute lifetime of LDs are studied in terms of facet and crystal degradations by accelerating aging test. Wear-out failures are found to finally dominate LD reliability after long time operation of several hundreds of thousands hours.
ISSN:1947-6981
DOI:10.1109/ISLC.2018.8516252