On-Chip Copper-Based vs. Optical Interconnects: Delay Uncertainty, Latency, Power, and Bandwidth Density Comparative Predictions

As CMOS technology is scaled, it has become increasingly difficult for conventional copper interconnect to satisfy different design requirements. On-chip optical interconnect has been considered as a potential substitute for electrical interconnect. In this paper, predictions of the performance of C...

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Bibliographic Details
Published in2006 International Interconnect Technology Conference pp. 39 - 41
Main Authors Guoqing Chen, Hui Chen, Haurylau, M., Nelson, N.A., Albonesi, D.H., Fauchet, P.M., Friedman, E.G.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2006
Subjects
Bandwidth
CMOS technology
Copper
Delay
Optical devices
Optical interconnections
Optical receivers
Optical transmitters
Uncertainty
Wire
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ISBN1424401046
9781424401048
ISSN2380-632X
DOI10.1109/IITC.2006.1648640

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Summary:As CMOS technology is scaled, it has become increasingly difficult for conventional copper interconnect to satisfy different design requirements. On-chip optical interconnect has been considered as a potential substitute for electrical interconnect. In this paper, predictions of the performance of CMOS compatible optical devices are made based on current state-of-art optical technologies. Based on these predictions, electrical and optical interconnects are compared for delay uncertainty, latency, power, and bandwidth density
ISBN:1424401046
9781424401048
ISSN:2380-632X
DOI:10.1109/IITC.2006.1648640