An Approach for Test Data Generation Based on Genetic Algorithm and Delete Mutation Operators

This paper introduces a novel method that generates the program test data based on 'Genetic Algorithm' and 'Delete Mutation Analysis'. This approach attempts to imporve the test suite by deleting the redundant test data and leads to an efficient test data set in terms of better m...

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Bibliographic Details
Published in2015 Second International Conference on Advances in Computing and Communication Engineering pp. 714 - 718
Main Authors Rani, Shweta, Suri, Bharti
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2015
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ISBN9781479917334
1479917338
DOI10.1109/ICACCE.2015.145

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Summary:This paper introduces a novel method that generates the program test data based on 'Genetic Algorithm' and 'Delete Mutation Analysis'. This approach attempts to imporve the test suite by deleting the redundant test data and leads to an efficient test data set in terms of better mutation score. In this approach, fitness is evaluated using mutation score and therefore, an adequate testdata is generated. Mutants based on delete operators are cost effective and, save huge time and effort in comparison with traditional mutant operators.
ISBN:9781479917334
1479917338
DOI:10.1109/ICACCE.2015.145