Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V

• Published in: Proceedings - European Test Workshop pp. 1 - 6
• Main Authors: Ghasemi, S. Maryam, Krautter, Jonas, Gheshlaghi, Tara, Meschkov, Sergej, Gnad, Dennis R. E., Tahoori, Mehdi B.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 20.05.2024
• Subjects: Degradation; Delays; Sensors; System-on-chip; Temperature measurement; Temperature sensors; Transient analysis
• ISSN: 1558-1780
• DOI: 10.1109/ETS61313.2024.10567607

Complex systems are subject to various hardware and software defects and faults through the entire design and deployment lifecycle. Many of such defects originate at the electrical or circuit levels, but manifest as functional failures in the field. In this study, we present a methodology for embedding and employing software-controlled runtime variation and degradation sensors on a RISC-V SoC to enable system-level and functional testing in the field. We demonstrate the effectiveness of the entire platform through an FPGA implementation. Delay defects and path degradations are emulated by injecting artificial delay elements into the critical path of a specific instruction. We also emulate the effect of workload-induced runtime stress with tunable software-controlled power wasters. Combining various sensors, we show that transient fluctuations, which are caused by temperature or workload, can be effectively separated from persistent delay increase, which is caused by latent manufacturing defects or aging.