APA (7th ed.) Citation

Beyne, S., Croes, K., Pedreira, O. V., Arnoldi, L., van der Veen, M. H., De Wolf, I., & Tokei, Z. (2019, October). Low-Frequency Noise Measurements for Electromigration Characterization in BEOL Interconnects. IEEE International Integrated Reliability Workshop final report, 1-9. https://doi.org/10.1109/IIRW47491.2019.8989897

Chicago Style (17th ed.) Citation

Beyne, S., K. Croes, O. Varela Pedreira, L. Arnoldi, M. H. van der Veen, I. De Wolf, and Zs Tokei. "Low-Frequency Noise Measurements for Electromigration Characterization in BEOL Interconnects." IEEE International Integrated Reliability Workshop Final Report Oct. 2019: 1-9. https://doi.org/10.1109/IIRW47491.2019.8989897.

MLA (9th ed.) Citation

Beyne, S., et al. "Low-Frequency Noise Measurements for Electromigration Characterization in BEOL Interconnects." IEEE International Integrated Reliability Workshop Final Report, Oct. 2019, pp. 1-9, https://doi.org/10.1109/IIRW47491.2019.8989897.