Cao, F., Chen, Y., Cao, Y., Ye, F., & Ren, J. (2017, October). A proved dither-injection method for memory effect in double sampling pipelined ADC. Proceedings 2017 IEEE 12th International Conference on ASIC : October 25-28, 2017, Guiyang, China, 754-757. https://doi.org/10.1109/ASICON.2017.8252585
Chicago Style (17th ed.) CitationCao, Fubiao, Yongzhen Chen, Yuefeng Cao, Fan Ye, and Junyan Ren. "A Proved Dither-injection Method for Memory Effect in Double Sampling Pipelined ADC." Proceedings 2017 IEEE 12th International Conference on ASIC : October 25-28, 2017, Guiyang, China Oct. 2017: 754-757. https://doi.org/10.1109/ASICON.2017.8252585.
MLA (9th ed.) CitationCao, Fubiao, et al. "A Proved Dither-injection Method for Memory Effect in Double Sampling Pipelined ADC." Proceedings 2017 IEEE 12th International Conference on ASIC : October 25-28, 2017, Guiyang, China, Oct. 2017, pp. 754-757, https://doi.org/10.1109/ASICON.2017.8252585.