A novel lie detection method based on extreme learning machine using P300

Machine learning-based lie detection has drawn much attention recently. In this paper, we used extreme learning machine (ELM), a recently-proposed machine learning method based on a single layer feedforward network (SLFN), to classify P300 potentials from guilty subject and non-P300 potentials from...

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Published inICISCE 2012 : IET International Conference on Information Science and Control Engineering 2012 : 7-9 December 2012 p. 3.74
Main Authors Xiong, Yijun, Yang, Yong, Gao, Junfeng
Format Conference Proceeding
LanguageEnglish
Published Stevenage, UK IET 2012
The Institution of Engineering & Technology
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ISBN9781849196413
1849196419
DOI10.1049/cp.2012.2471

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Summary:Machine learning-based lie detection has drawn much attention recently. In this paper, we used extreme learning machine (ELM), a recently-proposed machine learning method based on a single layer feedforward network (SLFN), to classify P300 potentials from guilty subject and non-P300 potentials from innocent subject. Back-propagation network and support vector machine classifiers were also used to compare with the proposed method. The number of hidden nodes in ELM was tuned using training with the 10-fold cross validation. The experimental results show that the proposed method reaches the highest classification accuracy with extremely less training and testing time, compared with the other classification models.
Bibliography:ObjectType-Article-1
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SourceType-Conference Papers & Proceedings-1
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ISBN:9781849196413
1849196419
DOI:10.1049/cp.2012.2471