APA (7th ed.) Citation

Copetti, T., Medeiros, G., Bolzani Poehls, L., Vargas, F., Kostin, S., Jenihhin, M., . . . Ubar, R. (2016, April). Gate-level modelling of NBTI-induced delays under process variations. 2016 17th Latin-American Test Symposium (LATS), 75-80. https://doi.org/10.1109/LATW.2016.7483343

Chicago Style (17th ed.) Citation

Copetti, Thiago, Guilherme Medeiros, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, and Raimund Ubar. "Gate-level Modelling of NBTI-induced Delays Under Process Variations." 2016 17th Latin-American Test Symposium (LATS) Apr. 2016: 75-80. https://doi.org/10.1109/LATW.2016.7483343.

MLA (9th ed.) Citation

Copetti, Thiago, et al. "Gate-level Modelling of NBTI-induced Delays Under Process Variations." 2016 17th Latin-American Test Symposium (LATS), Apr. 2016, pp. 75-80, https://doi.org/10.1109/LATW.2016.7483343.