Real Time Simulation of Transient Overvoltage and Common-Mode during Line-to-Ground Fault in DC Ungrounded Systems
Real Time (RT) simulation of Power Electronics (PE) allows engineers to interface real-time controls for controller hardware-in-the-loop CHiL. CHiL verification moves a design from Technology Readiness Level (TRL) 3 to TRL 4. For RT CHiL simulation of DC protection systems, the RT simulation platfor...
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| Published in | IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society Vol. 1; pp. 6451 - 6456 |
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| Main Authors | , , , , |
| Format | Conference Proceeding |
| Language | English |
| Published |
IEEE
01.10.2019
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| Subjects | |
| Online Access | Get full text |
| ISSN | 2577-1647 |
| DOI | 10.1109/IECON.2019.8927034 |
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| Abstract | Real Time (RT) simulation of Power Electronics (PE) allows engineers to interface real-time controls for controller hardware-in-the-loop CHiL. CHiL verification moves a design from Technology Readiness Level (TRL) 3 to TRL 4. For RT CHiL simulation of DC protection systems, the RT simulation platform must be able to simulate common mode behavior, various grounding schemes, and fault transients at sufficiently high resolution so as not to interfere with the protection system design. This paper demonstrates this capability using a Latency Based Linear Multistep Compount (LB-LMC) simulation method implemented in Field Programmable Gate Arrays (FPGAs), in order to achieve 50ns resolution of common mode behaviors, including Line-to-Ground (LG) overvoltages resulting from LG faults and fault recovery in ungrounded DC systems. This resolution in RT cannot be achieved with today's commercial off-the-shelf (COTS) RT CHiL platforms. Furthermore, this capability can be expanded to other grounding schemes and larger PE networks, enabling RT CHiL validation of protection schemes for networks of power electronic converters at TRL 4. |
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| AbstractList | Real Time (RT) simulation of Power Electronics (PE) allows engineers to interface real-time controls for controller hardware-in-the-loop CHiL. CHiL verification moves a design from Technology Readiness Level (TRL) 3 to TRL 4. For RT CHiL simulation of DC protection systems, the RT simulation platform must be able to simulate common mode behavior, various grounding schemes, and fault transients at sufficiently high resolution so as not to interfere with the protection system design. This paper demonstrates this capability using a Latency Based Linear Multistep Compount (LB-LMC) simulation method implemented in Field Programmable Gate Arrays (FPGAs), in order to achieve 50ns resolution of common mode behaviors, including Line-to-Ground (LG) overvoltages resulting from LG faults and fault recovery in ungrounded DC systems. This resolution in RT cannot be achieved with today's commercial off-the-shelf (COTS) RT CHiL platforms. Furthermore, this capability can be expanded to other grounding schemes and larger PE networks, enabling RT CHiL validation of protection schemes for networks of power electronic converters at TRL 4. |
| Author | Cuzner, Robert Vygoder, Mark Milton, Matthew Benigni, Andrea Gudex, Jacob |
| Author_xml | – sequence: 1 givenname: Mark surname: Vygoder fullname: Vygoder, Mark organization: University of Wisconsin-Milwaukee,Dept. of Electrical Engineering,Milwaukee,WI,USA,53212 – sequence: 2 givenname: Jacob surname: Gudex fullname: Gudex, Jacob organization: University of Wisconsin-Milwaukee,Dept. of Electrical Engineering,Milwaukee,WI,USA,53212 – sequence: 3 givenname: Robert surname: Cuzner fullname: Cuzner, Robert organization: University of Wisconsin-Milwaukee,Dept. of Electrical Engineering,Milwaukee,WI,USA,53212 – sequence: 4 givenname: Matthew surname: Milton fullname: Milton, Matthew organization: University of South Carolina,Dept. of Electrical Engineering,Columbia,SC,USA,29208 – sequence: 5 givenname: Andrea surname: Benigni fullname: Benigni, Andrea organization: University of South Carolina,Dept. of Electrical Engineering,Columbia,SC,USA,29208 |
| BookMark | eNotkM1KAzEYRaMo2Na-gG7yAqn5mySzlLGthWrBtuuSab6UwEwiM5lC317Rri4cDmdxx-gupggIPTE6Y4yWL6t5tfmcccrKmSm5pkLeoDHT3DBptOG3aMQLrQlTUj-gad-HmkouNaWFGqHuC2yDd6EFvA3t0NgcUsTJ411nYx8gZrw5Q3dOTbYnwDY6XKW2TZF8JAfYDV2IJ7wOEUhOZNml4ddY2KHJOET8VuF9PP1BcHh76TO0_SO697bpYXrdCdov5rvqnaw3y1X1uiaBMZMJd9aUStZe-kIxSkvwTCkNx7q2ygojmDoaKCxYgBooBxAGal847gUo58UEPf93AwAcvrvQ2u5yuF4kfgAZYV7w |
| ContentType | Conference Proceeding |
| DBID | 6IE 6IH CBEJK RIE RIO |
| DOI | 10.1109/IECON.2019.8927034 |
| DatabaseName | IEEE Electronic Library (IEL) Conference Proceedings IEEE Proceedings Order Plan (POP) 1998-present by volume IEEE Xplore All Conference Proceedings IEEE Electronic Library (IEL) IEEE Proceedings Order Plans (POP) 1998-present |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| EISBN | 1728148782 9781728148786 |
| EISSN | 2577-1647 |
| EndPage | 6456 |
| ExternalDocumentID | 8927034 |
| Genre | orig-research |
| GroupedDBID | 6IE 6IH ALMA_UNASSIGNED_HOLDINGS CBEJK M43 RIE RIO |
| ID | FETCH-LOGICAL-i118t-2da8964bf4f561009ef1667ecbba6a38316c8e5aeaeebe02ee38ebf5d2f3e6df3 |
| IEDL.DBID | RIE |
| IngestDate | Wed Aug 27 02:42:13 EDT 2025 |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-i118t-2da8964bf4f561009ef1667ecbba6a38316c8e5aeaeebe02ee38ebf5d2f3e6df3 |
| PageCount | 6 |
| ParticipantIDs | ieee_primary_8927034 |
| PublicationCentury | 2000 |
| PublicationDate | 2019-Oct. |
| PublicationDateYYYYMMDD | 2019-10-01 |
| PublicationDate_xml | – month: 10 year: 2019 text: 2019-Oct. |
| PublicationDecade | 2010 |
| PublicationTitle | IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society |
| PublicationTitleAbbrev | IECON |
| PublicationYear | 2019 |
| Publisher | IEEE |
| Publisher_xml | – name: IEEE |
| SSID | ssib042470056 |
| Score | 1.7305458 |
| Snippet | Real Time (RT) simulation of Power Electronics (PE) allows engineers to interface real-time controls for controller hardware-in-the-loop CHiL. CHiL... |
| SourceID | ieee |
| SourceType | Publisher |
| StartPage | 6451 |
| SubjectTerms | Circuit faults Engines Fault protection Field programmable gate arrays Hardware-in-the loop simulation Mathematical model microgrids Power distribution faults Power electronics Power system simulation Real-time systems Transient analysis |
| Title | Real Time Simulation of Transient Overvoltage and Common-Mode during Line-to-Ground Fault in DC Ungrounded Systems |
| URI | https://ieeexplore.ieee.org/document/8927034 |
| Volume | 1 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwELXaTkyAWsS3bmDEbZK6jjMXqoJUQEClbpUdn1EFJKhKFn495yQtAjGwRVaiRL6L75597x5jF6miQIrGcjMMkAupLVfaCi7jJDLG6lSnHijO7uR0Lm4Xo0WLXW65MIhYFZ9h319WZ_k2T0u_VTZQSUQOKtqsHStZc7U2viMiEfu2lhteTJAMbrwUoC_eIm-oH_yhoFIFkMkum21eXdeNvPbLwvTTz19dGf_7bXus903Vg4dtENpnLcy6bP1I6R94dgc8rd4bgS7IHVSRyTMg4Z5cmFamgpYT0JkFTxTJM-6l0aCmLgLBVORFzv32FN0x0eVbAasMrsYwz16qQbTQtDzvsfnk-nk85Y24Al8Rpih4ZLVKpDBOOJ9CBQm6UMoYU2O01IRbQ5kqHGnUSHYOIsShQuNGNnJDlNYND1gnyzM8ZGAqmfJQ079N-YGLtfONxWIbCm0Ijagj1vXztfyo-2csm6k6_nv4hO14m9UFc6esU6xLPKPAX5jzyuJfuK-wxw |
| linkProvider | IEEE |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwELVKGWAC1CK-8cCI23w4TjIXqhbagqCVulV2fEYVkKAqWfj1nJO0CMTAFlmJEvkuvnv2vXuEXCURBlJQminfAcaF1CySmjMRxp5SWiYysUBxPBGDGb-bB_MGud5wYQCgLD6Djr0sz_J1lhR2q6wbxR46KN8i2wHnPKjYWmvv4R4PbWPLNTPGibtDKwZoy7fQH6pHf2iolCGkv0fG65dXlSOvnSJXneTzV1_G_37dPml_k_Xo4yYMHZAGpC2yesIEkFp-B31evtcSXTQztIxNlgNJH9CJcW3KcUGhMtXUUkWylFlxNFqRFykCVWB5xuwGFd7Rl8VbTpcpvenRWfpSDoKmddPzNpn1b6e9AavlFdgSUUXOPC2jWHBluLFJlBODcYUIIVFKConI1RVJBIEECWhpxwPwI1Am0J7xQWjjH5JmmqVwRKgqhcpdiX83ZggmlMa2Fgu1y6VCPBIdk5adr8VH1UFjUU_Vyd_Dl2RnMB2PFqPh5P6U7Fr7VeVzZ6SZrwo4xzQgVxel9b8AJpK0FA |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=IECON+2019+-+45th+Annual+Conference+of+the+IEEE+Industrial+Electronics+Society&rft.atitle=Real+Time+Simulation+of+Transient+Overvoltage+and+Common-Mode+during+Line-to-Ground+Fault+in+DC+Ungrounded+Systems&rft.au=Vygoder%2C+Mark&rft.au=Gudex%2C+Jacob&rft.au=Cuzner%2C+Robert&rft.au=Milton%2C+Matthew&rft.date=2019-10-01&rft.pub=IEEE&rft.eissn=2577-1647&rft.volume=1&rft.spage=6451&rft.epage=6456&rft_id=info:doi/10.1109%2FIECON.2019.8927034&rft.externalDocID=8927034 |