Real Time Simulation of Transient Overvoltage and Common-Mode during Line-to-Ground Fault in DC Ungrounded Systems

Real Time (RT) simulation of Power Electronics (PE) allows engineers to interface real-time controls for controller hardware-in-the-loop CHiL. CHiL verification moves a design from Technology Readiness Level (TRL) 3 to TRL 4. For RT CHiL simulation of DC protection systems, the RT simulation platfor...

Full description

Saved in:
Bibliographic Details
Published inIECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society Vol. 1; pp. 6451 - 6456
Main Authors Vygoder, Mark, Gudex, Jacob, Cuzner, Robert, Milton, Matthew, Benigni, Andrea
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2019
Subjects
Online AccessGet full text
ISSN2577-1647
DOI10.1109/IECON.2019.8927034

Cover

Abstract Real Time (RT) simulation of Power Electronics (PE) allows engineers to interface real-time controls for controller hardware-in-the-loop CHiL. CHiL verification moves a design from Technology Readiness Level (TRL) 3 to TRL 4. For RT CHiL simulation of DC protection systems, the RT simulation platform must be able to simulate common mode behavior, various grounding schemes, and fault transients at sufficiently high resolution so as not to interfere with the protection system design. This paper demonstrates this capability using a Latency Based Linear Multistep Compount (LB-LMC) simulation method implemented in Field Programmable Gate Arrays (FPGAs), in order to achieve 50ns resolution of common mode behaviors, including Line-to-Ground (LG) overvoltages resulting from LG faults and fault recovery in ungrounded DC systems. This resolution in RT cannot be achieved with today's commercial off-the-shelf (COTS) RT CHiL platforms. Furthermore, this capability can be expanded to other grounding schemes and larger PE networks, enabling RT CHiL validation of protection schemes for networks of power electronic converters at TRL 4.
AbstractList Real Time (RT) simulation of Power Electronics (PE) allows engineers to interface real-time controls for controller hardware-in-the-loop CHiL. CHiL verification moves a design from Technology Readiness Level (TRL) 3 to TRL 4. For RT CHiL simulation of DC protection systems, the RT simulation platform must be able to simulate common mode behavior, various grounding schemes, and fault transients at sufficiently high resolution so as not to interfere with the protection system design. This paper demonstrates this capability using a Latency Based Linear Multistep Compount (LB-LMC) simulation method implemented in Field Programmable Gate Arrays (FPGAs), in order to achieve 50ns resolution of common mode behaviors, including Line-to-Ground (LG) overvoltages resulting from LG faults and fault recovery in ungrounded DC systems. This resolution in RT cannot be achieved with today's commercial off-the-shelf (COTS) RT CHiL platforms. Furthermore, this capability can be expanded to other grounding schemes and larger PE networks, enabling RT CHiL validation of protection schemes for networks of power electronic converters at TRL 4.
Author Cuzner, Robert
Vygoder, Mark
Milton, Matthew
Benigni, Andrea
Gudex, Jacob
Author_xml – sequence: 1
  givenname: Mark
  surname: Vygoder
  fullname: Vygoder, Mark
  organization: University of Wisconsin-Milwaukee,Dept. of Electrical Engineering,Milwaukee,WI,USA,53212
– sequence: 2
  givenname: Jacob
  surname: Gudex
  fullname: Gudex, Jacob
  organization: University of Wisconsin-Milwaukee,Dept. of Electrical Engineering,Milwaukee,WI,USA,53212
– sequence: 3
  givenname: Robert
  surname: Cuzner
  fullname: Cuzner, Robert
  organization: University of Wisconsin-Milwaukee,Dept. of Electrical Engineering,Milwaukee,WI,USA,53212
– sequence: 4
  givenname: Matthew
  surname: Milton
  fullname: Milton, Matthew
  organization: University of South Carolina,Dept. of Electrical Engineering,Columbia,SC,USA,29208
– sequence: 5
  givenname: Andrea
  surname: Benigni
  fullname: Benigni, Andrea
  organization: University of South Carolina,Dept. of Electrical Engineering,Columbia,SC,USA,29208
BookMark eNotkM1KAzEYRaMo2Na-gG7yAqn5mySzlLGthWrBtuuSab6UwEwiM5lC317Rri4cDmdxx-gupggIPTE6Y4yWL6t5tfmcccrKmSm5pkLeoDHT3DBptOG3aMQLrQlTUj-gad-HmkouNaWFGqHuC2yDd6EFvA3t0NgcUsTJ411nYx8gZrw5Q3dOTbYnwDY6XKW2TZF8JAfYDV2IJ7wOEUhOZNml4ddY2KHJOET8VuF9PP1BcHh76TO0_SO697bpYXrdCdov5rvqnaw3y1X1uiaBMZMJd9aUStZe-kIxSkvwTCkNx7q2ygojmDoaKCxYgBooBxAGal847gUo58UEPf93AwAcvrvQ2u5yuF4kfgAZYV7w
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DOI 10.1109/IECON.2019.8927034
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 1728148782
9781728148786
EISSN 2577-1647
EndPage 6456
ExternalDocumentID 8927034
Genre orig-research
GroupedDBID 6IE
6IH
ALMA_UNASSIGNED_HOLDINGS
CBEJK
M43
RIE
RIO
ID FETCH-LOGICAL-i118t-2da8964bf4f561009ef1667ecbba6a38316c8e5aeaeebe02ee38ebf5d2f3e6df3
IEDL.DBID RIE
IngestDate Wed Aug 27 02:42:13 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i118t-2da8964bf4f561009ef1667ecbba6a38316c8e5aeaeebe02ee38ebf5d2f3e6df3
PageCount 6
ParticipantIDs ieee_primary_8927034
PublicationCentury 2000
PublicationDate 2019-Oct.
PublicationDateYYYYMMDD 2019-10-01
PublicationDate_xml – month: 10
  year: 2019
  text: 2019-Oct.
PublicationDecade 2010
PublicationTitle IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society
PublicationTitleAbbrev IECON
PublicationYear 2019
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssib042470056
Score 1.7305458
Snippet Real Time (RT) simulation of Power Electronics (PE) allows engineers to interface real-time controls for controller hardware-in-the-loop CHiL. CHiL...
SourceID ieee
SourceType Publisher
StartPage 6451
SubjectTerms Circuit faults
Engines
Fault protection
Field programmable gate arrays
Hardware-in-the loop simulation
Mathematical model
microgrids
Power distribution faults
Power electronics
Power system simulation
Real-time systems
Transient analysis
Title Real Time Simulation of Transient Overvoltage and Common-Mode during Line-to-Ground Fault in DC Ungrounded Systems
URI https://ieeexplore.ieee.org/document/8927034
Volume 1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwELXaTkyAWsS3bmDEbZK6jjMXqoJUQEClbpUdn1EFJKhKFn495yQtAjGwRVaiRL6L75597x5jF6miQIrGcjMMkAupLVfaCi7jJDLG6lSnHijO7uR0Lm4Xo0WLXW65MIhYFZ9h319WZ_k2T0u_VTZQSUQOKtqsHStZc7U2viMiEfu2lhteTJAMbrwUoC_eIm-oH_yhoFIFkMkum21eXdeNvPbLwvTTz19dGf_7bXus903Vg4dtENpnLcy6bP1I6R94dgc8rd4bgS7IHVSRyTMg4Z5cmFamgpYT0JkFTxTJM-6l0aCmLgLBVORFzv32FN0x0eVbAasMrsYwz16qQbTQtDzvsfnk-nk85Y24Al8Rpih4ZLVKpDBOOJ9CBQm6UMoYU2O01IRbQ5kqHGnUSHYOIsShQuNGNnJDlNYND1gnyzM8ZGAqmfJQ079N-YGLtfONxWIbCm0Ijagj1vXztfyo-2csm6k6_nv4hO14m9UFc6esU6xLPKPAX5jzyuJfuK-wxw
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwELVKGWAC1CK-8cCI23w4TjIXqhbagqCVulV2fEYVkKAqWfj1nJO0CMTAFlmJEvkuvnv2vXuEXCURBlJQminfAcaF1CySmjMRxp5SWiYysUBxPBGDGb-bB_MGud5wYQCgLD6Djr0sz_J1lhR2q6wbxR46KN8i2wHnPKjYWmvv4R4PbWPLNTPGibtDKwZoy7fQH6pHf2iolCGkv0fG65dXlSOvnSJXneTzV1_G_37dPml_k_Xo4yYMHZAGpC2yesIEkFp-B31evtcSXTQztIxNlgNJH9CJcW3KcUGhMtXUUkWylFlxNFqRFykCVWB5xuwGFd7Rl8VbTpcpvenRWfpSDoKmddPzNpn1b6e9AavlFdgSUUXOPC2jWHBluLFJlBODcYUIIVFKConI1RVJBIEECWhpxwPwI1Am0J7xQWjjH5JmmqVwRKgqhcpdiX83ZggmlMa2Fgu1y6VCPBIdk5adr8VH1UFjUU_Vyd_Dl2RnMB2PFqPh5P6U7Fr7VeVzZ6SZrwo4xzQgVxel9b8AJpK0FA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=IECON+2019+-+45th+Annual+Conference+of+the+IEEE+Industrial+Electronics+Society&rft.atitle=Real+Time+Simulation+of+Transient+Overvoltage+and+Common-Mode+during+Line-to-Ground+Fault+in+DC+Ungrounded+Systems&rft.au=Vygoder%2C+Mark&rft.au=Gudex%2C+Jacob&rft.au=Cuzner%2C+Robert&rft.au=Milton%2C+Matthew&rft.date=2019-10-01&rft.pub=IEEE&rft.eissn=2577-1647&rft.volume=1&rft.spage=6451&rft.epage=6456&rft_id=info:doi/10.1109%2FIECON.2019.8927034&rft.externalDocID=8927034