Spectral response of gamma and electron irradiated pin photodiode

The optical spectral response of Si pin photodiodes was examined after gamma and electron irradiation. We observed both a significant decrease in the peak optical response and peak position with increasing total dose. This effect was successfully explained by modeling the degradation of the minority...

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Published in2001 6th European Conference on Radiation and Its Effects on Components and Systems pp. 450 - 454
Main Authors Onoda, S., Hirao, T., Laird, J.S., Mori, H., Okamoto, T., Koizumi, Y., Itoh, H.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2001
Subjects
Cloning
Degradation
Electron optics
Energy loss
Gamma rays
Lamps
Optical losses
Optical sensors
PIN photodiodes
Telephony
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ISBN9780780373136
0780373138
DOI10.1109/RADECS.2001.1159321

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Abstract The optical spectral response of Si pin photodiodes was examined after gamma and electron irradiation. We observed both a significant decrease in the peak optical response and peak position with increasing total dose. This effect was successfully explained by modeling the degradation of the minority carrier diffusion length in the base region. The diffusion length damage factor was estimated in the context of the non-ionization energy loss (NIEL). A close agreement was found between the observed degradation behavior and that predicted by NIEL.
AbstractList The optical spectral response of Si pin photodiodes was examined after gamma and electron irradiation. We observed both a significant decrease in the peak optical response and peak position with increasing total dose. This effect was successfully explained by modeling the degradation of the minority carrier diffusion length in the base region. The diffusion length damage factor was estimated in the context of the non-ionization energy loss (NIEL). A close agreement was found between the observed degradation behavior and that predicted by NIEL.
Author Mori, H.
Laird, J.S.
Hirao, T.
Okamoto, T.
Koizumi, Y.
Itoh, H.
Onoda, S.
Author_xml – sequence: 1
  givenname: S.
  surname: Onoda
  fullname: Onoda, S.
  organization: Tokai Univ., Kanagawa, Japan
– sequence: 2
  givenname: T.
  surname: Hirao
  fullname: Hirao, T.
– sequence: 3
  givenname: J.S.
  surname: Laird
  fullname: Laird, J.S.
– sequence: 4
  givenname: H.
  surname: Mori
  fullname: Mori, H.
– sequence: 5
  givenname: T.
  surname: Okamoto
  fullname: Okamoto, T.
– sequence: 6
  givenname: Y.
  surname: Koizumi
  fullname: Koizumi, Y.
– sequence: 7
  givenname: H.
  surname: Itoh
  fullname: Itoh, H.
BookMark eNotT81KxDAYDKigrn2CveQFuuZr0iY5lrr-wILg6nlJmi8aaZOS9uLbW3GHgYEZmGFuyWVMEQnZAtsBMH3_1j7su-OuYgxWo9a8ggtSaKnYSi458OaaFPP8zVaIWgjV3JD2OGG_ZDPQjPOU4ow0efppxtFQEx3F4S9OkYacjQtmQUenEOn0lZbkQnJ4R668GWYszrohH4_79-65PLw-vXTtoQzA6qVE8JyLRvJ1WnquAYS1yoPUqpJqDZRDaIwSEmyle62ktVZb7yqope4V35Dtf29AxNOUw2jyz-l8lP8CAa1KEg
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/RADECS.2001.1159321
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
Accès UT - IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Xplore
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EndPage 454
ExternalDocumentID 1159321
GroupedDBID 6IE
6IK
6IL
AAJGR
AAVQY
AAWTH
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
OCL
RIE
RIL
ID FETCH-LOGICAL-i105t-e1f3346730457f39114bb8f17982784678de16a8471b29c987bbb9bfd21579c83
IEDL.DBID RIE
ISBN 9780780373136
0780373138
IngestDate Tue Aug 26 17:16:32 EDT 2025
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-i105t-e1f3346730457f39114bb8f17982784678de16a8471b29c987bbb9bfd21579c83
PageCount 5
ParticipantIDs ieee_primary_1159321
PublicationCentury 2000
PublicationDate 20010000
PublicationDateYYYYMMDD 2001-01-01
PublicationDate_xml – year: 2001
  text: 20010000
PublicationDecade 2000
PublicationTitle 2001 6th European Conference on Radiation and Its Effects on Components and Systems
PublicationTitleAbbrev RADECS
PublicationYear 2001
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000454486
Score 1.3007487
Snippet The optical spectral response of Si pin photodiodes was examined after gamma and electron irradiation. We observed both a significant decrease in the peak...
SourceID ieee
SourceType Publisher
StartPage 450
SubjectTerms Cloning
Degradation
Electron optics
Energy loss
Gamma rays
Lamps
Optical losses
Optical sensors
PIN photodiodes
Telephony
Title Spectral response of gamma and electron irradiated pin photodiode
URI https://ieeexplore.ieee.org/document/1159321
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PS8MwFA5zJ08qm_ibHDzarlm6_DgPxxAmog52G0mTaNG1pXSX_fW-tF1F8SD00OZQ8gi89728930PoVuaKMEUeD9JjQtiAnmKZMIENII0jgvrlPIE58Ujmy_jh9Vk1UN3HRfGWls3n9nQv9a1fJMnW39VNgL0AnADcp0DLljD1eruU7yUXCxYnZmLiHJKqGgFdvbfrFUdIpEcPYOd0xefH5Kw_e2P-Sp1eJkdocV-Y01XyUe4rXSY7H5pNv5358do-E3kw09diDpBPZsNwJN6dmWpPnHZNMhanDv8pjYbhVVm8H4yDk7L0isXACbFRZrh4j2vcpPmxg7Rcnb_Op0H7SSFIAX8VAWWOErBJfqyKHcUHFystXBerMwXHiFgGUuY8pFKj2UiBddaS-0MAAIuE0FPUT_LM3uGsBsTzSLDBNUyjqzSfAKHGxkdG8BWhJyjgTd_XTRiGevW8ou_ly_RYdPU5Z8r1K_Krb2GKF_pm_p4vwDnqaGV
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwELUqGGAC1CK-8cBI0rh2EnuuqAq0FYJW6lbZsQ0RNKmidOHXc07SIhADUobEQ-STpbt3vnvvELqhieSRBO8nqLYeI5CniIhrjwaQxsXcWCkdwXk8iYYz9jAP5y10u-XCGGOq5jPju9eqlq_zZO2uyrqAXgBuQK6zGzLGwpqttb1RcWJyjEdVbs4DGlNCeSOxs_mOGt0hEojuM1jaf3EZIvGbH_-YsFIFmMEBGm-2VveVvPvrUvnJ5y_Vxv_u_RB1vql8-GkbpI5Qy2Rt8KWOX1nID1zULbIG5xa_yuVSYplpvJmNg9OicNoFgErxKs3w6i0vc53m2nTQbHA37Q-9ZpaClwKCKj1DLKXgFF1hNLYUXBxTilsnV-ZKjxCytCGRdLFK9UQieKyUEspqgASxSDg9RjtZnpkThG2PqCjQEadKsMBIFYdwvIFWTAO6IuQUtZ35i1Utl7FoLD_7e_ka7Q2n49FidD95PEf7dYuXey7QTlmszSXE_FJdVUf9BZbkpOI
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2001+6th+European+Conference+on+Radiation+and+Its+Effects+on+Components+and+Systems&rft.atitle=Spectral+response+of+gamma+and+electron+irradiated+pin+photodiode&rft.au=Onoda%2C+S.&rft.au=Hirao%2C+T.&rft.au=Laird%2C+J.S.&rft.au=Mori%2C+H.&rft.date=2001-01-01&rft.pub=IEEE&rft.isbn=9780780373136&rft.spage=450&rft.epage=454&rft_id=info:doi/10.1109%2FRADECS.2001.1159321&rft.externalDocID=1159321
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780373136/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780373136/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9780780373136/sc.gif&client=summon&freeimage=true