Improving an SEU hard design using a pulsed laser
The purpose of this work is to present one investigation utilizing a pulsed laser as a tool to improve the Single Event Upset tolerance of a memory cell. These results coming with a previous ion testing evaluation of the circuit allow an optimization of the design. The laser results permit a more de...
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| Published in | 2001 6th European Conference on Radiation and Its Effects on Components and Systems pp. 243 - 247 |
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| Main Authors | , , , |
| Format | Conference Proceeding |
| Language | English |
| Published |
IEEE
2001
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| Subjects | |
| Online Access | Get full text |
| ISBN | 9780780373136 0780373138 |
| DOI | 10.1109/RADECS.2001.1159287 |
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| Abstract | The purpose of this work is to present one investigation utilizing a pulsed laser as a tool to improve the Single Event Upset tolerance of a memory cell. These results coming with a previous ion testing evaluation of the circuit allow an optimization of the design. The laser results permit a more detailed analysis of the phenomenon leading to the upset and a precise localization of the most sensitive areas. As a result the behavior verification of the design combined with the use of robust elementary blocks strengthens the hardening capabilities of the cell. |
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| AbstractList | The purpose of this work is to present one investigation utilizing a pulsed laser as a tool to improve the Single Event Upset tolerance of a memory cell. These results coming with a previous ion testing evaluation of the circuit allow an optimization of the design. The laser results permit a more detailed analysis of the phenomenon leading to the upset and a precise localization of the most sensitive areas. As a result the behavior verification of the design combined with the use of robust elementary blocks strengthens the hardening capabilities of the cell. |
| Author | Roche, F.M. Dutertre, J.M. Lewis, D. Fouillat, P. |
| Author_xml | – sequence: 1 givenname: J.M. surname: Dutertre fullname: Dutertre, J.M. organization: Lab. d'Informatique de Robotique et de Microelectronique de Montpellier, France – sequence: 2 givenname: F.M. surname: Roche fullname: Roche, F.M. organization: Lab. d'Informatique de Robotique et de Microelectronique de Montpellier, France – sequence: 3 givenname: P. surname: Fouillat fullname: Fouillat, P. organization: Lab. d'Informatique de Robotique et de Microelectronique de Montpellier, France – sequence: 4 givenname: D. surname: Lewis fullname: Lewis, D. organization: Lab. d'Informatique de Robotique et de Microelectronique de Montpellier, France |
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| Snippet | The purpose of this work is to present one investigation utilizing a pulsed laser as a tool to improve the Single Event Upset tolerance of a memory cell. These... |
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| StartPage | 243 |
| SubjectTerms | Circuit testing CMOS technology Design optimization Flip-flops Logic Optical design Optical pulses Radiation hardening Robustness Single event upset |
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| Title | Improving an SEU hard design using a pulsed laser |
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