SoC-Based Pattern Recognition Systems for Non Destructive Testing

• Published in: Machine Learning, Optimization, and Big Data Vol. 9432; pp. 209 - 221
• Main Authors: Schiaratura, Omar, Ansaloni, Pietro, Lughi, Giovanni, Neri, Mattia, Roffilli, Matteo, Serpi, Fabrizio, Simonetto, Andrea
• Format: Book Chapter
• Language: English
• Published: Switzerland Springer International Publishing AG 2016; Springer International Publishing
• Series: Lecture Notes in Computer Science
• Subjects: Algorithms & data structures; ARM; Artificial intelligence; CUDA; Information retrieval; Non-destructive testing; OpenCL; SoC
• ISBN: 3319279254; 9783319279251
• ISSN: 0302-9743; 1611-3349
• DOI: 10.1007/978-3-319-27926-8_18

Non Destructive Testing (NDT) is one of the most important aspect in modern manufacturing companies. Automation of this task improves productivity and reliability of distribution chains. We present an optimized implementation of common pattern recognition algorithms that performs NDT on factory products. To the aim of enhancing the industrial integration, our implementation is highly optimized to work on SoC-based (System on Chip: an integrated circuit that integrates all components of a computer into a single chip.) hardware and we worked with the initial idea of an overall design for these devices. While perfectly working on general purpose SoCs, the best performances are achieved on GPU accelerated ones. We reached the notable performance of a PC-based workstation by exploiting technologies like CUDA and BLAS for embedded SoCs. The test case is a collection of toy scenarios commonly found in manufacturing companies.