An O(n/spl middot/(log/sub 2/(n))/sup 2/) algorithm for computing the reliability of k-out-of-n:G and k-to-l-out-of-n:G systems
This paper presents the RAFFT-GFP (Recursively Applied Fast Fourier Transform for Generator Function Products) algorithm as a computationally superior algorithm for expressing and computing the reliability of k-out-of-n:G and k-to-l-out-of-n:G systems using the fast Fourier transform. Originally sug...
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| Published in | IEEE transactions on reliability Vol. 44; no. 1; pp. 132 - 136 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
IEEE
01.03.1995
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| Subjects | |
| Online Access | Get full text |
| ISSN | 0018-9529 |
| DOI | 10.1109/24.376535 |
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| Summary: | This paper presents the RAFFT-GFP (Recursively Applied Fast Fourier Transform for Generator Function Products) algorithm as a computationally superior algorithm for expressing and computing the reliability of k-out-of-n:G and k-to-l-out-of-n:G systems using the fast Fourier transform. Originally suggested by Barlow and Heidtmann (1984), generating functions provide a clear, concise method for computing the reliabilities of such systems. By recursively applying the FFT to computing generator function products, the RAFFT-GFP achieves an overall asymptotic computational complexity of O(n/spl middot/(log/sub 2/(n))/sup 2/) for computing system reliability. Algebraic manipulations suggested by Upadhyaya and Pham (1993) are reformulated in the context of generator functions to reduce the number of computations. The number of computations and the CPU time are used to compare the performance of the RAFFT-GFP algorithm to the best found in the literature. Due to larger overheads required, the RAFFT-GFP algorithm is superior for problem sizes larger than about 4000 components, in terms of both computation and CPU time for the examples studied in this paper. Lastly, studies of very large systems with unequal reliabilities indicate that the binomial distribution gives a good approximation for generating function coefficients, allowing algebraic solutions for system reliability.< > |
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| ISSN: | 0018-9529 |
| DOI: | 10.1109/24.376535 |