Estimating Specimen Height Using SEM Working Distance

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 30; no. Supplement_1
Main Authors Yoon, Jiwon, Cheon, Jisung, Hong, Won Ki, Baek, Hyeon Ji, Park, Jin Wook, Hwang, Kyu Man, Lee, Sung-Ho
Format Journal Article
LanguageEnglish
Published Oxford Oxford University Press 24.07.2024
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ISSN1431-9276
1435-8115
DOI10.1093/mam/ozae044.199

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Bibliography:SourceType-Scholarly Journals-1
content type line 14
ObjectType-Report-1
ISSN:1431-9276
1435-8115
DOI:10.1093/mam/ozae044.199