电解解离氢键层层组装薄膜

利用电解解离的方法研究层层组装氢键复合薄膜聚(2-乙基-2噁唑啉)/聚丙烯酸(PEOX/PAA)的解离行为,将制备在导电氧化铟锡玻璃(ITO)上的薄膜放置于电解池的正极进行解离,得到均匀平坦而非粗糙的薄膜。通过衰减全反射(ATR)和循环伏安法(CV)的分析说明,引起氢键薄膜解离的是正极附近形成的pH梯度区间,该区间靠近电极呈酸性、远离电极呈碱性。此外,对比薄膜在电解池正负极的解离行为,进一步证明正负极附近形成的不同pH梯度区间将导致薄膜解离形貌和厚度差异的产生。电解液的pH以及电解电压均影响氢键薄膜在正极的解离行为,通过分析提出了一个较为适宜的电解解离条件。...

Full description

Saved in:
Bibliographic Details
Published in功能高分子学报 Vol. 31; no. 1; pp. 20 - 27
Main Author 苏超;杨曙光
Format Journal Article
LanguageChinese
Published 东华大学材料科学与工程学院 ,纤维材料改性国家重点实验室 ,东华大学先进低维材料中心,上海201620 2018
Subjects
层层组装膜;氢键;电解解离;pH梯度区间
pH梯度区间
氢键
pH gradient range
layer-by-layer film
electrodissolution
电解解离
层层组装膜
hydrogen bond
Online AccessGet full text
ISSN1008-9357
DOI10.14133/j.cnki.1008-9357.20171021001

Cover

More Information
Summary:利用电解解离的方法研究层层组装氢键复合薄膜聚(2-乙基-2噁唑啉)/聚丙烯酸(PEOX/PAA)的解离行为,将制备在导电氧化铟锡玻璃(ITO)上的薄膜放置于电解池的正极进行解离,得到均匀平坦而非粗糙的薄膜。通过衰减全反射(ATR)和循环伏安法(CV)的分析说明,引起氢键薄膜解离的是正极附近形成的pH梯度区间,该区间靠近电极呈酸性、远离电极呈碱性。此外,对比薄膜在电解池正负极的解离行为,进一步证明正负极附近形成的不同pH梯度区间将导致薄膜解离形貌和厚度差异的产生。电解液的pH以及电解电压均影响氢键薄膜在正极的解离行为,通过分析提出了一个较为适宜的电解解离条件。
Bibliography:Disassembly of hydrogen bonded layer-by-layer(LbL)film,composed of poly(acrylic acid)(PAA)and poly(2-ethyl-2-oxazoline)(PEOX),is studied by an electrochemical stimulus.Poly(2-oxazoline)s have been widely studied for biomedical applications due to their biocompatibility,thermal responsive behavior and easy chemical modification.Nowadays,one emerging research area for the development of biomedicine and gene engineer focuses on the controlled dissolution of LbL assemblies.A new method to trigger the hydrogen bonded LbL film dissolution near the positive electrode in the electrolytic bath is reported,which can obtain a uniform and transparent film.Through the analysis of Fourier Transform Infrared Attenuated Total Reflection(FTIR-ATR)and Cyclic Voltammetry(CV),the pH gradient range which is induced by the electrolysis of water is pointed out.Near the positive electrode,OH-ions moved to the electrode and H+ions produced by electrolysis of water form a pH gradient range which resulting in the closer to electrode,th
ISSN:1008-9357
DOI:10.14133/j.cnki.1008-9357.20171021001