Ni对Pd/Al2O3密偶催化剂催化性能的影响

考察了助剂Ni对以改性氧化铝为载体的单Pd密偶催化剂的影响.结果表明,掺杂Ni可以明显改善对C3H8的催化性能,尤其对老化催化剂效果显著.此外,Ni的添加使老化催化剂Pd/Al2O3的起燃温度（T50）和完全转化温度（T90）分别降低31和30℃.单反应测试结果表明,添加Ni能明显提高对C3H8＋NO反应的催化性能.采用H2程序升温还原、CO吸附、高倍透射电镜和X射线光电子能谱等手段对新鲜和老化催化剂进行了表征.结果表明,掺杂Ni不仅可以抑制活性组分PdO x的烧结,减少金属态Pd0的产生,而且可以提高PdO x物种的可还原能力和有效比表面积....

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Bibliographic Details
Published in催化学报 Vol. 36; no. 7; pp. 994 - 1000
Main Author 方瑞梅 崔亚娟 史忠华 龚茂初 陈耀强
Format Journal Article
LanguageChinese
Published 四川大学化学学院，绿色化学与技术教育部重点实验室，四川成都610064%四川大学环境与工程学院，四川成都610064 2015
四川大学化学学院，绿色化学与技术教育部重点实验室，四川成都610064%四川大学化学学院，绿色化学与技术教育部重点实验室，四川成都610064
四川大学化学工程学院，四川成都610064
Subjects
丙烷
密偶催化剂
氧化铝
钯
镍
Close-coupled catalyst
密偶催化剂
丙烷
Palladium
Nickel
镍
Alumina
氧化铝
Propane
钯
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ISSN0253-9837
1872-2067
DOI10.1016/S1872-2067(15)60850-6

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Summary:考察了助剂Ni对以改性氧化铝为载体的单Pd密偶催化剂的影响.结果表明,掺杂Ni可以明显改善对C3H8的催化性能,尤其对老化催化剂效果显著.此外,Ni的添加使老化催化剂Pd/Al2O3的起燃温度（T50）和完全转化温度（T90）分别降低31和30℃.单反应测试结果表明,添加Ni能明显提高对C3H8＋NO反应的催化性能.采用H2程序升温还原、CO吸附、高倍透射电镜和X射线光电子能谱等手段对新鲜和老化催化剂进行了表征.结果表明,掺杂Ni不仅可以抑制活性组分PdO x的烧结,减少金属态Pd0的产生,而且可以提高PdO x物种的可还原能力和有效比表面积.
Bibliography:Ruimei Fang , Yajuan Cui , Zhonghua Shi , Maochu Gong , Yaoqiang Chen （ a College of Chemical Engineering, Sichuan Univerxity, Chengdu 610064, Sichuan, China b College ofArchitecture ＆ Environment, Sichuan University, Chengdu 610064, Sichuan, China ;c Key Laboratory of Green Chemistry ＆ Technology of the Ministry of Education, College of Chemistry, Sichuan University, Chengdu 610064, Sichuan, China）
The influence of a nickel promoter on the catalytic behavior of a modified alumina supported Pd close-coupled catalyst was investigated. Doping with nickel improved the catalytic activity for the reactions of CsHs, especially over the aged catalyst. T50 and T90 of the aged Pd catalyst were decreased by 31 and 30℃, respectively. The single reaction results revealed that doping with bli pro- moted the catalytic activity for the C3H8 ＋ NO reaction. The fresh and aged catalysts were character- ized by H2-temperature-programmed reduction, CO chemisorption, high resolution transmission electron microscopy, and X-ray phot
ISSN:0253-9837
1872-2067
DOI:10.1016/S1872-2067(15)60850-6