韩宝妮;文平;董作典;唐旭;宋燕. (2018). 宇航用微波芯片电容器电极镀层可靠性评价方法研究. 电子元件与材料, 37(2), 85-91. https://doi.org/10.14106/j.cnki.1001-2028.2018.02.016
Chicago Style (17th ed.) Citation韩宝妮;文平;董作典;唐旭;宋燕. "宇航用微波芯片电容器电极镀层可靠性评价方法研究." 电子元件与材料 37, no. 2 (2018): 85-91. https://doi.org/10.14106/j.cnki.1001-2028.2018.02.016.
MLA (9th ed.) Citation韩宝妮;文平;董作典;唐旭;宋燕. "宇航用微波芯片电容器电极镀层可靠性评价方法研究." 电子元件与材料, vol. 37, no. 2, 2018, pp. 85-91, https://doi.org/10.14106/j.cnki.1001-2028.2018.02.016.
Warning: These citations may not always be 100% accurate.