宇航用微波芯片电容器电极镀层可靠性评价方法研究
微波芯片电容器作为一种新型的电容器,已被广泛应用于宇航,而国军标和行业标准中目前并无适用的评价方法.针对宇航用芯片电容器的应用方式和失效模式,设计了一套宇航用微波芯片电容器镀层可靠性的评价方法,用以评价其可靠性是否满足宇航应用需求.以国产芯片电容器为例对该评价方法进行验证.结果表明,该评价方法可有效评价和验证芯片电容器电极镀层的可靠性....
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| Published in | 电子元件与材料 Vol. 37; no. 2; pp. 85 - 91 |
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| Main Author | |
| Format | Journal Article |
| Language | Chinese |
| Published |
西安空间无线电技术研究所,陕西 西安,710100
2018
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1001-2028 |
| DOI | 10.14106/j.cnki.1001-2028.2018.02.016 |
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| Summary: | 微波芯片电容器作为一种新型的电容器,已被广泛应用于宇航,而国军标和行业标准中目前并无适用的评价方法.针对宇航用芯片电容器的应用方式和失效模式,设计了一套宇航用微波芯片电容器镀层可靠性的评价方法,用以评价其可靠性是否满足宇航应用需求.以国产芯片电容器为例对该评价方法进行验证.结果表明,该评价方法可有效评价和验证芯片电容器电极镀层的可靠性. |
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| Bibliography: | HAN Baoni, WEN Ping, DONG Zuodian, TANG Xu, SONG Yan (Xi’an Space Radio Technology Research Institute, Xi’an 710100, China) 51-1241/TN aerospace application; microwave device; chip capacitors; electrode coating; reliability; evaluation methods As a new type of capacitors, the microwave chip capacitor has been widely used in aerospace application. However, there is no any applicable evaluation method in military specifications and professional standards. Aiming at application manner and failure modes of chip capacitors for aerospace application, a whole set of method to evaluate the reliability of electrode coating of the microwave chip capacitor was proposed, which could estimate whether the reliability was qualified for aerospace application. Take the domestic monolayer chip capacitor as an example, the method was verified. The experimental results show that the methods can evaluate and verify the reliability of electrode coating of the microwave chip capacitor effectively. |
| ISSN: | 1001-2028 |
| DOI: | 10.14106/j.cnki.1001-2028.2018.02.016 |