星载65nm抗辐射GNSS接收机ASIC的SEFI实验方法

在抗辐射GNSS接收机的研发过程中，由于Xilinx 600万门FPGA在轨单粒子翻转（Single Event Upset，SEU）效应严重，而自主研发抗辐射GNSS接收机ASIC是最有效的解决办法。以航天五院重点型号项目“XX-2”项目为依托，在国内首次采用65nm抗辐射工艺，用单个ASIC芯片实现了1200万门规模的星载抗辐射GNSS接收机ASIC。但是，对此款新工艺／大规模／功能复杂的ASIC芯片进行单粒子功能中断测定是一个难题。通过在FPGA上模拟GNSS数字中频信号和DSP配置输入，然后由芯片的EMIF接口实时读取芯片内部关键数据来进行SEU／SEFI的判断，并设计了SEFI判断准...

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Bibliographic Details
Published in电子技术应用 Vol. 43; no. 1; pp. 53 - 56
Main Author 李梦良 乐立鹏 张建军 郑宏超
Format Journal Article
LanguageChinese
Published 中国航天电子技术研究院772所,北京,100076 2017
Subjects
EMIF接口
GNSS接收机
单粒子功能中断（SEFI）
辐照实验
辐照实验
SEFI
EMIF接口
EMIF interface
GNSS接收机
单粒子功能中断(SEFI)
GNSS receiver
radiation test
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ISSN0258-7998
DOI10.16157/j.issn.0258-7998.2017.01.014

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Summary:在抗辐射GNSS接收机的研发过程中，由于Xilinx 600万门FPGA在轨单粒子翻转（Single Event Upset，SEU）效应严重，而自主研发抗辐射GNSS接收机ASIC是最有效的解决办法。以航天五院重点型号项目“XX-2”项目为依托，在国内首次采用65nm抗辐射工艺，用单个ASIC芯片实现了1200万门规模的星载抗辐射GNSS接收机ASIC。但是，对此款新工艺／大规模／功能复杂的ASIC芯片进行单粒子功能中断测定是一个难题。通过在FPGA上模拟GNSS数字中频信号和DSP配置输入，然后由芯片的EMIF接口实时读取芯片内部关键数据来进行SEU／SEFI的判断，并设计了SEFI判断准则和相应的辐照实验实现方案。
Bibliography:GNSS receiver ; EMIF interface ; radiation test ; SEFI
Since the serious single event upset（SEU） effect of Xilinx 6 million gates FPGA in orbit, a self-reliance radiation-hard- ened GNSS receiver ASIC is the most efficient way when developing the radiation-hardened GNSS receiver. Based on the key pro- ject ＂XX-2＂ of the CAST, the on-board radiation-hardened GNSS receiver ASIC of 12 million gates is implemented with the 65 nm radiation-hardened cells on the single chip, which is the first domestic 65 nm radiation-hardened ASIC. However, the single event function interruption（SEFI） measurement is a problem for this new, large scale, function complex ASIC. By simulating the GNSS digital IF signal input and the DSP configuration data, some important data that decides SEU/SEFI is read out through the EMIF interface. This paper also designs SEFI decision principles and the corresponding radiation test scheme.
Li Mengliang, Yue Lipeng, Zhang Jianjun, Zheng Hongchao （772 Research Institution, China Space Electronic Tec
ISSN:0258-7998
DOI:10.16157/j.issn.0258-7998.2017.01.014