Vein patterning screens and the defectively organized tributaries mutants in Arabidopsis thaliana

Leaf veins form a closed network that transports essential photosynthates, water and signaling molecules to the developing plant. The formation of the patterns of these networks during leaf ontogeny is an active subject of modeling and computer simulation. To investigate the vein patterning process,...

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Published inThe Plant journal : for cell and molecular biology Vol. 56; no. 2; pp. 251 - 263
Main Authors Petricka, Jalean Joyanne, Clay, Nicole Kho, Nelson, Timothy Mark
Format Journal Article
LanguageEnglish
Published Oxford, UK Oxford, UK : Blackwell Publishing Ltd 01.10.2008
Blackwell Publishing Ltd
Blackwell Science
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ISSN0960-7412
1365-313X
1365-313X
DOI10.1111/j.1365-313X.2008.03595.x

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Summary:Leaf veins form a closed network that transports essential photosynthates, water and signaling molecules to the developing plant. The formation of the patterns of these networks during leaf ontogeny is an active subject of modeling and computer simulation. To investigate the vein patterning process, we performed screens for defects in juvenile leaf vein patterning in Arabidopsis thaliana lines subjected to mutagenesis via diepoxybutane, activation tagging or the Dissociation/Activator transposon. We identified over 40 vein pattern defective lines, providing a phenotypic resource for the testing of vein patterning models. In addition, we report the chromosomal linkage for 13 of these, eight of which were successfully cloned. We further describe the phenotypes of five of these mutants, which we call the defectively organized tributaries (dot) mutants, and their corresponding molecular identities. The diversity of the individual genes affected in this collection of pattern mutants suggests that vein pattern is highly sensitive to perturbations in many cellular processes. Despite this diversity of causes, the resulting pattern defects fall into a limited number of classes, including parallel, spurred, misaligned, open, midvein gap and irregularly spaced. These classes may represent sensitivities to cellular processes associated with the DOT genes. The ontogeny of common defective patterns should be accommodated into any robust model for the ontogeny and evolution of pattern.
Bibliography:http://dx.doi.org/10.1111/j.1365-313X.2008.03595.x
The author responsible for the distribution of materials integral to the findings presented in this article in accordance with the policy described in the Instructions for Authors is: Timothy Nelson
.
timothy.nelson@yale.edu
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ISSN:0960-7412
1365-313X
1365-313X
DOI:10.1111/j.1365-313X.2008.03595.x