基于PLLFS锁定时间的测量方法误差分析
随着跳频通信的发展,锁相环频率综合器的锁定时间被限定得愈发严格,TD-LTE标准中已被缩短到20μs,这要求研发人员精准地把握锁定时间。使用信号源分析仪能够快速且准确地测出锁定时间,但是国内的高校和研究单位还没有广泛普及,目前测试锁定时间的方法混杂,测试误差极大,始终没有形成统一的业内标准方法。鉴于此,选用了一款基于ADF4351的PLLFS模块作为固定测试对象,分别采用5种不同方法针对同一跳变频点的锁定时间进行了实测,并首次以"信号源分析仪法"的测试结果为标准,横向对比了"频谱仪测量法"、"示波器直接测量法"、"检测VCO调谐电压法"和"检测LD引脚法"的测量误差,对比发现这4种方法无法满足...
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Published in | 电子技术应用 Vol. 42; no. 6; pp. 41 - 45 |
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Main Author | |
Format | Journal Article |
Language | Chinese |
Published |
中国科学院微电子研究所,北京,100029%中国科学院微电子研究所,北京100029
2016
湖南大学物理与微电子学院,湖南长沙250100 |
Subjects | |
Online Access | Get full text |
ISSN | 0258-7998 |
DOI | 10.16157/j.issn.0258-7998.2016.06.011 |
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Summary: | 随着跳频通信的发展,锁相环频率综合器的锁定时间被限定得愈发严格,TD-LTE标准中已被缩短到20μs,这要求研发人员精准地把握锁定时间。使用信号源分析仪能够快速且准确地测出锁定时间,但是国内的高校和研究单位还没有广泛普及,目前测试锁定时间的方法混杂,测试误差极大,始终没有形成统一的业内标准方法。鉴于此,选用了一款基于ADF4351的PLLFS模块作为固定测试对象,分别采用5种不同方法针对同一跳变频点的锁定时间进行了实测,并首次以"信号源分析仪法"的测试结果为标准,横向对比了"频谱仪测量法"、"示波器直接测量法"、"检测VCO调谐电压法"和"检测LD引脚法"的测量误差,对比发现这4种方法无法满足100μs内锁定时间的测试需求,必须使用信号源分析仪才能测得准确的锁定时间。 |
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Bibliography: | Zhao Wen, Yin Junjian, Zhao Dongliang (1.Institute of Microelectronies of Chinese Academy of Sciences, Beijing 100029, China ; 2.School of Physics and Mieroeleetronics, Hunan University, Changsha 250100, China) With the development of frequency hopping communication, the locking- time of phase- locked loop frequency synthesizer is limited more and more strictly, even shortens to 20 μs in the TD- LTE standard. Yet there has not been uniform industry standard for related measurement, and further more, no systematic analysis and comparison have been made for different locking-time methods. Based on this situation, this paper selected five methods to measure the locking- time of a same ADF4351 PPLFS,further more, with the standard of the result of using the signal source analyzer method, we analysised and compared the deviation errors of the spectrum analyzer method, the oscilloscope direct measurement, the VCO tuning- voltage- test method and the LD pin- test method. Therefore the results showed these four method |
ISSN: | 0258-7998 |
DOI: | 10.16157/j.issn.0258-7998.2016.06.011 |