Use of intensity quotients and differences in absolute structure refinement

Several methods for absolute structure refinement were tested using single-crystal X-ray diffraction data collected using Cu Kα radiation for 23 crystals with no element heavier than oxygen: conventional refinement using an inversion twin model, estimation using intensity quotients in SHELXL2012, es...

Full description

Saved in:
Bibliographic Details
Published inActa crystallographica Section B, Structural science, crystal engineering and materials Vol. 69; no. Pt 3; p. 249
Main Authors Parsons, Simon, Flack, Howard D, Wagner, Trixie
Format Journal Article
LanguageEnglish
Published England Blackwell Publishing Ltd 01.06.2013
Subjects
Online AccessGet full text
ISSN2052-5192
2052-5206
2052-5206
DOI10.1107/S2052519213010014

Cover

More Information
Summary:Several methods for absolute structure refinement were tested using single-crystal X-ray diffraction data collected using Cu Kα radiation for 23 crystals with no element heavier than oxygen: conventional refinement using an inversion twin model, estimation using intensity quotients in SHELXL2012, estimation using Bayesian methods in PLATON, estimation using restraints consisting of numerical intensity differences in CRYSTALS and estimation using differences and quotients in TOPAS-Academic where both quantities were coded in terms of other structural parameters and implemented as restraints. The conventional refinement approach yielded accurate values of the Flack parameter, but with standard uncertainties ranging from 0.15 to 0.77. The other methods also yielded accurate values of the Flack parameter, but with much higher precision. Absolute structure was established in all cases, even for a hydrocarbon. The procedures in which restraints are coded explicitly in terms of other structural parameters enable the Flack parameter to correlate with these other parameters, so that it is determined along with those parameters during refinement.
Bibliography:SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 14
ISSN:2052-5192
2052-5206
2052-5206
DOI:10.1107/S2052519213010014