A Simplified Measurement Configuration for Evaluation of Relative Permittivity Using a Microstrip Ring Resonator with a Variational Method-Based Algorithm
In this paper, we present a simple yet efficient method for determination of the relative permittivity of thin dielectric materials. An analysis that led to definition of the proper size and placement of a sample under test (SUT) on the surface of a microstrip ring resonator (MRR) was presented base...
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| Published in | Sensors (Basel, Switzerland) Vol. 22; no. 3; p. 928 |
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| Main Authors | , , |
| Format | Journal Article |
| Language | English |
| Published |
Switzerland
MDPI AG
25.01.2022
MDPI |
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| Online Access | Get full text |
| ISSN | 1424-8220 1424-8220 |
| DOI | 10.3390/s22030928 |
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| Abstract | In this paper, we present a simple yet efficient method for determination of the relative permittivity of thin dielectric materials. An analysis that led to definition of the proper size and placement of a sample under test (SUT) on the surface of a microstrip ring resonator (MRR) was presented based on the full-wave simulations and measurements on benchmark materials. For completeness, the paper includes short descriptions of the design of an MRR and the variational method-based algorithm that processes the measured values. The efficiency of the proposed method is demonstrated on 12 SUT materials of different thicknesses and permittivity values, and the accuracy between 0% and 10% of the relative error was achieved for all SUTs thinner than 2 mm. |
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| AbstractList | In this paper, we present a simple yet efficient method for determination of the relative permittivity of thin dielectric materials. An analysis that led to definition of the proper size and placement of a sample under test (SUT) on the surface of a microstrip ring resonator (MRR) was presented based on the full-wave simulations and measurements on benchmark materials. For completeness, the paper includes short descriptions of the design of an MRR and the variational method-based algorithm that processes the measured values. The efficiency of the proposed method is demonstrated on 12 SUT materials of different thicknesses and permittivity values, and the accuracy between 0% and 10% of the relative error was achieved for all SUTs thinner than 2 mm. In this paper, we present a simple yet efficient method for determination of the relative permittivity of thin dielectric materials. An analysis that led to definition of the proper size and placement of a sample under test (SUT) on the surface of a microstrip ring resonator (MRR) was presented based on the full-wave simulations and measurements on benchmark materials. For completeness, the paper includes short descriptions of the design of an MRR and the variational method-based algorithm that processes the measured values. The efficiency of the proposed method is demonstrated on 12 SUT materials of different thicknesses and permittivity values, and the accuracy between 0% and 10% of the relative error was achieved for all SUTs thinner than 2 mm.In this paper, we present a simple yet efficient method for determination of the relative permittivity of thin dielectric materials. An analysis that led to definition of the proper size and placement of a sample under test (SUT) on the surface of a microstrip ring resonator (MRR) was presented based on the full-wave simulations and measurements on benchmark materials. For completeness, the paper includes short descriptions of the design of an MRR and the variational method-based algorithm that processes the measured values. The efficiency of the proposed method is demonstrated on 12 SUT materials of different thicknesses and permittivity values, and the accuracy between 0% and 10% of the relative error was achieved for all SUTs thinner than 2 mm. |
| Audience | Academic |
| Author | Bartolić, Juraj Joler, Miroslav Raj, Alex Noel Joseph |
| AuthorAffiliation | 2 Department of Electronic Engineering, College of Engineering, Shantou University, Shantou 515063, China 3 Department of Wireless Communications, Faculty of Electrical Engineering and Computing, University of Zagreb, 10000 Zagreb, Croatia; juraj.bartolic@fer.hr 1 Department of Computer Engineering, Faculty of Engineering, University of Rijeka, 51000 Rijeka, Croatia; mjoler@riteh.hr |
| AuthorAffiliation_xml | – name: 2 Department of Electronic Engineering, College of Engineering, Shantou University, Shantou 515063, China – name: 3 Department of Wireless Communications, Faculty of Electrical Engineering and Computing, University of Zagreb, 10000 Zagreb, Croatia; juraj.bartolic@fer.hr – name: 1 Department of Computer Engineering, Faculty of Engineering, University of Rijeka, 51000 Rijeka, Croatia; mjoler@riteh.hr |
| Author_xml | – sequence: 1 givenname: Miroslav orcidid: 0000-0001-8080-2342 surname: Joler fullname: Joler, Miroslav – sequence: 2 givenname: Alex Noel Joseph orcidid: 0000-0003-1505-3159 surname: Raj fullname: Raj, Alex Noel Joseph – sequence: 3 givenname: Juraj orcidid: 0000-0001-9003-0198 surname: Bartolić fullname: Bartolić, Juraj |
| BackLink | https://www.ncbi.nlm.nih.gov/pubmed/35161672$$D View this record in MEDLINE/PubMed |
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| References | Bernard (ref_9) 1991; 39 Kulkarni (ref_13) 2015; 4 ref_12 ref_11 ref_10 ref_32 Venkatesh (ref_3) 2005; 47 ref_31 ref_30 ref_19 Yamashita (ref_22) 1968; 16 ref_18 ref_17 ref_16 ref_15 Murali (ref_26) 2014; 4 Low (ref_14) 2017; 9 Sharma (ref_28) 2015; 4 ref_25 ref_24 ref_21 ref_20 ref_1 ref_2 ref_27 ref_8 Yamashita (ref_23) 1968; 16 ref_5 ref_4 Ahmed (ref_29) 2018; 83 ref_7 ref_6 |
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| SubjectTerms | Algorithms Design Dielectrics full-wave analysis material characterization measurement of relative permittivity Methods microstrip ring resonator optimal material-under-test size variational method |
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| Title | A Simplified Measurement Configuration for Evaluation of Relative Permittivity Using a Microstrip Ring Resonator with a Variational Method-Based Algorithm |
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