A Simplified Measurement Configuration for Evaluation of Relative Permittivity Using a Microstrip Ring Resonator with a Variational Method-Based Algorithm

• Published in: Sensors (Basel, Switzerland) Vol. 22; no. 3; p. 928
• Main Authors: Joler, Miroslav, Raj, Alex Noel Joseph, Bartolić, Juraj
• Format: Journal Article
• Language: English
• Published: Switzerland MDPI AG 25.01.2022; MDPI
• Subjects: Algorithms; Design; Dielectrics; full-wave analysis; material characterization; measurement of relative permittivity; Methods; microstrip ring resonator; optimal material-under-test size; variational method; United States; measurement of relative permittivity; material characterization; optimal material-under-test size; variational method; full-wave analysis; microstrip ring resonator
• ISSN: 1424-8220; 1424-8220
• DOI: 10.3390/s22030928

In this paper, we present a simple yet efficient method for determination of the relative permittivity of thin dielectric materials. An analysis that led to definition of the proper size and placement of a sample under test (SUT) on the surface of a microstrip ring resonator (MRR) was presented based on the full-wave simulations and measurements on benchmark materials. For completeness, the paper includes short descriptions of the design of an MRR and the variational method-based algorithm that processes the measured values. The efficiency of the proposed method is demonstrated on 12 SUT materials of different thicknesses and permittivity values, and the accuracy between 0% and 10% of the relative error was achieved for all SUTs thinner than 2 mm.