Quantum oscillations from generic surface Fermi arcs and bulk chiral modes in Weyl semimetals

We re-examine the question of quantum oscillations from surface Fermi arcs and chiral modes in Weyl semimetals. By introducing two tools - semiclassical phase-space quantization and a numerical implementation of a layered construction of Weyl semimetals - we discover several important generalization...

Full description

Saved in:
Bibliographic Details
Published inScientific reports Vol. 6; no. 1; p. 23741
Main Authors Zhang, Yi, Bulmash, Daniel, Hosur, Pavan, Potter, Andrew C., Vishwanath, Ashvin
Format Journal Article
LanguageEnglish
Published London Nature Publishing Group UK 01.04.2016
Nature Publishing Group
Subjects
Online AccessGet full text
ISSN2045-2322
2045-2322
DOI10.1038/srep23741

Cover

More Information
Summary:We re-examine the question of quantum oscillations from surface Fermi arcs and chiral modes in Weyl semimetals. By introducing two tools - semiclassical phase-space quantization and a numerical implementation of a layered construction of Weyl semimetals - we discover several important generalizations to previous conclusions that were implicitly tailored to the special case of identical Fermi arcs on top and bottom surfaces. We show that the phase-space quantization picture fixes an ambiguity in the previously utilized energy-time quantization approach and correctly reproduces the numerically calculated quantum oscillations for generic Weyl semimetals with distinctly curved Fermi arcs on the two surfaces. Based on these methods, we identify a ‘magic’ magnetic-field angle where quantum oscillations become independent of sample thickness, with striking experimental implications. We also analyze the stability of these quantum oscillations to disorder and show that the high-field oscillations are expected to persist in samples whose thickness parametrically exceeds the quantum mean free path.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
content type line 23
ISSN:2045-2322
2045-2322
DOI:10.1038/srep23741