Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm

Approaches to high-speed atomic force microscopy typically involve some combination of novel mechanical design to increase the physical bandwidth and advanced controllers to take maximum advantage of the physical capabilities. For certain classes of samples, however, imaging time can be reduced on s...

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Bibliographic Details
Published inReview of scientific instruments Vol. 85; no. 6; pp. 066101 - 66103
Main Authors Huang, Peng, Andersson, Sean B.
Format Journal Article
LanguageEnglish
Published United States American Institute of Physics 01.06.2014
AIP Publishing LLC
Subjects
ALGORITHMS
ATOMIC FORCE MICROSCOPY
Deoxyribonucleic acid
DESIGN
DNA
DNA - chemistry
DNA - ultrastructure
Imaging
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Microscopy
Microscopy, Atomic Force - methods
Raster
Raster scanning
Scientific apparatus & instruments
Online AccessGet full text
ISSN0034-6748
1089-7623
1527-2400
1089-7623
DOI10.1063/1.4881682

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Summary:Approaches to high-speed atomic force microscopy typically involve some combination of novel mechanical design to increase the physical bandwidth and advanced controllers to take maximum advantage of the physical capabilities. For certain classes of samples, however, imaging time can be reduced on standard instruments by reducing the amount of measurement that is performed to image the sample. One such technique is the local raster scan algorithm, developed for imaging of string-like samples. Here we provide experimental results on the use of this technique to image DNA samples, demonstrating the efficacy of the scheme and illustrating the order-of-magnitude improvement in imaging time that it provides.
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Electronic mail: sanderss@bu.edu.
This research was performed while P. Huang was with the Department of Mechanical Engineering, Boston University, Boston, Massachusetts 02215, USA.
ISSN:0034-6748
1089-7623
1527-2400
1089-7623
DOI:10.1063/1.4881682