Gas cluster ion beam SEM for imaging of large tissue samples with 10 nm isotropic resolution

We demonstrate gas cluster ion beam scanning electron microscopy (SEM), in which wide-area ion milling is performed on a series of thick tissue sections. This three-dimensional electron microscopy technique acquires datasets with <10 nm isotropic resolution of each section, and these can then be...

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Published inNature methods Vol. 17; no. 1; pp. 68 - 71
Main Authors Hayworth, Kenneth J., Peale, David, Januszewski, Michał, Knott, Graham W., Lu, Zhiyuan, Xu, C. Shan, Hess, Harald F.
Format Journal Article
LanguageEnglish
Published New York Nature Publishing Group US 01.01.2020
Nature Publishing Group
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ISSN1548-7091
1548-7105
1548-7105
DOI10.1038/s41592-019-0641-2

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Summary:We demonstrate gas cluster ion beam scanning electron microscopy (SEM), in which wide-area ion milling is performed on a series of thick tissue sections. This three-dimensional electron microscopy technique acquires datasets with <10 nm isotropic resolution of each section, and these can then be stitched together to span the sectioned volume. Incorporating gas cluster ion beam SEM into existing single-beam and multibeam SEM workflows should be straightforward, increasing reliability while improving z resolution by a factor of three or more. An alternative to focused ion beam scanning electron microscopy (FIB-SEM), gas cluster ion beam scanning electron microscopy (GCIB-SEM) is compatible with large tissue samples while achieving similar isotropic resolution.
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ISSN:1548-7091
1548-7105
1548-7105
DOI:10.1038/s41592-019-0641-2