Performance analysis of the V-BLAST algorithm: an analytical approach

A geometrically based analytical approach to the performance analysis of the V-BLAST algorithm is presented in this paper, which is based on the analytical model of the Gramm-Schmidt process. This approach presents a new geometrical view of the V-BLAST and explains some of its properties in a comple...

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Published inIEEE transactions on wireless communications Vol. 3; no. 4; pp. 1326 - 1337
Main Authors Loyka, S., Gagnon, F.
Format Journal Article
LanguageEnglish
Published Piscataway, NJ IEEE 01.07.2004
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN1536-1276
1558-2248
DOI10.1109/TWC.2004.830853

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Summary:A geometrically based analytical approach to the performance analysis of the V-BLAST algorithm is presented in this paper, which is based on the analytical model of the Gramm-Schmidt process. This approach presents a new geometrical view of the V-BLAST and explains some of its properties in a complete and rigorous form, including a statistical analysis of postprocessing signal-to-noise ratios for a 2/spl times/n system (where n is the number of receive antennas). Closed-form analytical expressions of the vector signal at ith processing step and its power are presented. A rigorous proof that the diversity order at ith step (without optimal ordering) is (n-m+i) is given (where m is the number of transmit antennas). It is shown that the optimal ordering is based on the least correlation criterion and that the after-processing signal power is determined by the channel correlation matrices in a fashion similar to the channel capacity. Closed-form analytical expressions are derived for outage probabilities and average BER of a 2/spl times/n system. The effect of the optimal ordering is shown to be to increase the first step SNR by 3 dB (rather than to increase the diversity order as one might intuitively expect based on the selection combining argument) and to increase the second step outage probability twice.
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ISSN:1536-1276
1558-2248
DOI:10.1109/TWC.2004.830853