A low‐cost digital calibration scheme for high‐resolution SAR ADC using Adaptive‐LMS

This paper presents a novel low‐cost digital calibration scheme using Adaptive‐LMS for high‐resolution SAR ADCs. This proposed Adaptive‐LMS is realized by perturbing adaptive analog offset and skipping several LSBs' calibration. Compared with a digital calibration scheme based on conventional L...

Full description

Saved in:
Bibliographic Details
Published inElectronics letters Vol. 58; no. 25; pp. 949 - 951
Main Authors Yang, Yongkui, Yin, Tingting, Liu, Jiping, Yao, Enyi
Format Journal Article
LanguageEnglish
Published Stevenage John Wiley & Sons, Inc 01.12.2022
Wiley
Subjects
Accuracy
Algorithms
Calibration
Manufacturing
Semiconductors
Testing time
Online AccessGet full text
ISSN0013-5194
1350-911X
1350-911X
DOI10.1049/ell2.12659

Cover

More Information
Summary:This paper presents a novel low‐cost digital calibration scheme using Adaptive‐LMS for high‐resolution SAR ADCs. This proposed Adaptive‐LMS is realized by perturbing adaptive analog offset and skipping several LSBs' calibration. Compared with a digital calibration scheme based on conventional LMS, the design saves not only die cost but also testing cost (less testing time). During the testing process, the proposed method requires only 16,000 samples to calibrate the capacitor mismatch and the SNDR is improved from 54.1 dB to 68.1 dB for a 12‐bit SAR ADC.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:0013-5194
1350-911X
1350-911X
DOI:10.1049/ell2.12659