Quantum-enhanced metrology for multiple phase estimation with noise

We present a general quantum metrology framework to study the simultaneous estimation of multiple phases in the presence of noise as a discretized model for phase imaging. This approach can lead to nontrivial bounds of the precision for multiphase estimation. Our results show that simultaneous estim...

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Bibliographic Details
Published inScientific reports Vol. 4; no. 1; p. 5933
Main Authors Yue, Jie-Dong, Zhang, Yu-Ran, Fan, Heng
Format Journal Article
LanguageEnglish
Published London Nature Publishing Group UK 04.08.2014
Nature Publishing Group
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ISSN2045-2322
2045-2322
DOI10.1038/srep05933

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Summary:We present a general quantum metrology framework to study the simultaneous estimation of multiple phases in the presence of noise as a discretized model for phase imaging. This approach can lead to nontrivial bounds of the precision for multiphase estimation. Our results show that simultaneous estimation (SE) of multiple phases is always better than individual estimation (IE) of each phase even in noisy environment. The utility of the bounds of multiple phase estimation for photon loss channels is exemplified explicitly. When noise is low, those bounds possess the Heisenberg scale showing quantum-enhanced precision with the O ( d ) advantage for SE, where d is the number of phases. However, this O ( d ) advantage of SE scheme in the variance of the estimation may disappear asymptotically when photon loss becomes significant and then only a constant advantage over that of IE scheme demonstrates. Potential application of those results is presented.
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ISSN:2045-2322
2045-2322
DOI:10.1038/srep05933