Identifying and manipulating single atoms with scanning transmission electron microscopy

• Published in: Chemical communications (Cambridge, England) Vol. 58; no. 88; pp. 12274 - 12285
• Main Author: Susi, Toma
• Format: Journal Article
• Language: English
• Published: England Royal Society of Chemistry 03.11.2022; The Royal Society of Chemistry
• Subjects: Carbon nanotubes; Chemistry; Crystal structure; Electron beams; Electron irradiation; Graphene; Graphite - chemistry; Microscopy, Electron, Scanning Transmission; Nanotubes, Carbon - chemistry; Radiation damage; Scanning probe microscopes; Scanning transmission electron microscopy; Silicon - chemistry; Thermal stability
• ISSN: 1359-7345; 1364-548X; 1364-548X
• DOI: 10.1039/d2cc04807h

The manipulation of individual atoms has developed from visionary speculation into an established experimental science. Using focused electron irradiation in a scanning transmission electron microscope instead of a physical tip in a scanning probe microscope confers several benefits, including thermal stability of the manipulated structures, the ability to reach into bulk crystals, and the chemical identification of single atoms. However, energetic electron irradiation also presents unique challenges, with an inevitable possibility of irradiation damage. Understanding the underlying mechanisms will undoubtedly continue to play an important role to guide experiments. Great progress has been made in several materials including graphene, carbon nanotubes, and crystalline silicon in the eight years since the discovery of electron-beam manipulation, but the important challenges that remain will determine how far we can expect to progress in the near future. A focused electron beam can be used to manipulate covalently bound impurities within crystal lattices with atomic precision.