Wet chemical synthesis of WO3 thin films for supercapacitor application
Tungstic oxide (WO 3 ) thin films have been synthesized by wet chemical method, i.e., successive ionic layer adsorption and reaction (SILAR) method. These films are characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and optical absorption techniques. The XRD pattern reve...
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Published in | The Korean journal of chemical engineering Vol. 32; no. 5; pp. 974 - 979 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
Springer US
01.05.2015
한국화학공학회 |
Subjects | |
Online Access | Get full text |
ISSN | 0256-1115 1975-7220 |
DOI | 10.1007/s11814-014-0323-9 |
Cover
Summary: | Tungstic oxide (WO
3
) thin films have been synthesized by wet chemical method, i.e., successive ionic layer adsorption and reaction (SILAR) method. These films are characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and optical absorption techniques. The XRD pattern revealed the formation of polycrystalline WO
3
films. Scanning electron micrographs demonstrate the three-dimensional aggregated irregular extended rod shaped morphology of WO
3
thin films. The WO
3
film showed a direct band gap of 2.5 eV. The WO
3
film exhibited specific capacitance of 266 F·g
−1
in 1 M Na
2
SO
4
electrolyte at the scan rate of 10 mVs
−1
. |
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Bibliography: | G704-000406.2015.32.5.013 |
ISSN: | 0256-1115 1975-7220 |
DOI: | 10.1007/s11814-014-0323-9 |