Investigation of Reflectance Distribution and Trend for the Double Ray Located in the Northwest of Tycho Crater

Analysis of lunar samples returned by the US Apollo missions revealed that the lunar highlands consist of anorthosite, plagioclase, pyroxene, and olivine; also, the lunar maria are composed of materials such as basalt and ilmenite. More recently, the remote sensing approach has enabled reduction of...

Full description

Saved in:
Bibliographic Details
Published inJournal of astronomy and space sciences Vol. 32; no. 2; pp. 161 - 166
Main Authors Yi, Eung Seok, Kim, Kyeong Ja, Choi, Yi Re, Kim, Yong Ha, Lee, Sung Soon, Lee, Seung Ryeol
Format Journal Article
LanguageEnglish
Published 한국우주과학회 01.06.2015
The Korean Space Science Society
Subjects
Online AccessGet full text
ISSN2093-5587
2093-1409
DOI10.5140/JASS.2015.32.2.161

Cover

More Information
Summary:Analysis of lunar samples returned by the US Apollo missions revealed that the lunar highlands consist of anorthosite, plagioclase, pyroxene, and olivine; also, the lunar maria are composed of materials such as basalt and ilmenite. More recently, the remote sensing approach has enabled reduction of the time required to investigate the entire lunar surface, compared to the approach of returning samples. Moreover, remote sensing has also made it possible to determine the existence of specific minerals and to examine wide areas. In this paper, an investigation was performed on the reflectance distribution and its trend. The results were applied to the example of the double ray stretched in parallel lines from the Tycho crater to the third-quadrant of Mare Nubium. Basic research and background information for the investigation of lunar surface characteristics is also presented. For this research, resources aboard the SELenological and ENgineering Explorer (SELENE), a Japanese lunar probe, were used. These included the Multiband Imager (MI) in the Lunar Imager / Spectrometer (LISM). The data of these instruments were edited through the toolkit, an image editing and analysis tool, Exelis Visual Information Solution (ENVI).
Bibliography:G704-000106.2015.32.2.003
ISSN:2093-5587
2093-1409
DOI:10.5140/JASS.2015.32.2.161