Surface graphitization analysis of cerium-polished HFCVD diamond films with micro-raman spectra

• Published in: Journal of rare earths Vol. 26; no. 3; pp. 362 - 366
• Main Author: 王树彬 孙玉静 田莳
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.06.2008; School of Materials Science and Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China
• Subjects: cerium; diamond films; polishing; rare earths; surface graphitization; 抛光技术; 金刚石; 铈元素; surface graphitization; cerium; diamond films; polishing; rare earths
• ISSN: 1002-0721; 2509-4963
• DOI: 10.1016/S1002-0721(08)60096-4

The etching technique using Ce is a convenient and fast method for polishing and shaping diamond films. In this study, the influence of polishing parameters such as polishing temperature and time on the surface crystallinity and phase composition of diamond films was thoroughly investigated via the analysis of Raman spectra such as FWHM and ID/IG. Moreover, the issue on the graphitization of diamond after polishing with Ce was further researched through the detailed study of the depth distribution of Raman data including FWHM and ID/IG, and a result completely different from the hot-iron metal polished ones was obtained. The results showed that polished diamond films had considerably higher diamond content than those before polishing, and not a bit of graphitization was found in the polished ones, owing to a higher solubility of carbon in rare earth metal Ce than that in transition metals, and the original crystallinity of the films polished with Ce did not deteriorate.