BiFeO3 thin films of (1 1 1)-orientation deposited on SrRuO3 buffered Pt/TiO2/SiO2/Si(1 0 0) substrates

Saved in:
Bibliographic Details
Published inActa materialia Vol. 58; no. 5; pp. 1688 - 1697
Main Authors Wu, Jiagang, Wang, John
Format Journal Article
LanguageEnglish
Published Kidlington Elsevier 01.03.2010
Subjects
Applied sciences
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Materials science
Metals. Metallurgy
Methods of deposition of films and coatings; film growth and epitaxy
Physics
Dielectric materials
BiFe0
Conduction mechanism
Titanium oxide
Orientation
Ferroelectric properties
Silica
Mechanism
Thin film
thin films
Dielectric relaxation
Online AccessGet full text
ISSN1359-6454
DOI10.1016/j.actamat.2009.11.011

Cover

More Information
ISSN:1359-6454
DOI:10.1016/j.actamat.2009.11.011