Outage analysis in wireless channels with multiple interferers subject to shadowing and fading using a compound pdf model

Wireless communication systems are subject to short- and long-term fading of the channel. Instead of the commonly used Nakagami–lognormal model to account for the conditions existing in these shadowed fading channels, a compound probability density function (pdf) model is used to evaluate the perfor...

Full description

Saved in:
Bibliographic Details
Published inInternational journal of electronics and communications Vol. 61; no. 4; pp. 255 - 261
Main Author Shankar, P.M.
Format Journal Article
LanguageEnglish
Published Elsevier GmbH 01.01.2007
Subjects
Online AccessGet full text
ISSN1434-8411
1618-0399
DOI10.1016/j.aeue.2006.04.006

Cover

More Information
Summary:Wireless communication systems are subject to short- and long-term fading of the channel. Instead of the commonly used Nakagami–lognormal model to account for the conditions existing in these shadowed fading channels, a compound probability density function (pdf) model is used to evaluate the performance of wireless systems. While the Nakagami–lognormal lacks a closed-form solution to the pdf of the received power in shadowed fading channels, the compound pdf has an analytical expression for the pdf of the received signal power. The synergy between these two models for the analysis of wireless systems is explored by calculating the bit error rate in a DPSK modem as well as the outage probability in a wireless system in a shadowed fading channel. This is followed by the computation of the outage probability in the general case where both the desired and cochannels are subject to shadowing and fading. The analyses were carried out for both fixed number of cochannels and random number of cochannels. Results demonstrate the usefulness of the compound pdf model for the performance analyses of wireless systems in shadowed fading channels.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1434-8411
1618-0399
DOI:10.1016/j.aeue.2006.04.006