Plasmonic silicon Schottky photodetectors: The physics behind graphene enhanced internal photoemission
Recent experiments have shown that the plasmonic assisted internal photoemission from a metal to silicon can be significantly enhanced by introducing a monolayer of graphene between the two media. This is despite the limited absorption in a monolayer of undoped graphene ( ∼ π α = 2.3 % ). Here we pr...
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Published in | APL photonics Vol. 2; no. 2; pp. 026103 - 026103-6 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
AIP Publishing LLC
01.02.2017
|
Online Access | Get full text |
ISSN | 2378-0967 2378-0967 |
DOI | 10.1063/1.4973537 |
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Summary: | Recent experiments have shown that the plasmonic assisted internal photoemission from a metal to
silicon can be
significantly enhanced by introducing a monolayer of graphene between the two media. This is despite the limited
absorption in a monolayer of undoped graphene (
∼
π
α
=
2.3
%
). Here we propose a physical model where surface plasmon polaritons
enhance the absorption in a single-layer graphene by enhancing the field along the interface. The
relatively long relaxation time in graphene allows for multiple attempts for the carrier to overcome the
Schottky barrier
and penetrate into the semiconductor. Interface disorder is crucial to overcome the momentum
mismatch in the internal photoemission process. Our results show that quantum efficiencies in
the range of few tens of percent are obtainable under reasonable experimental assumptions.
This insight may pave the way for the implementation of compact, high efficiency
silicon based
detectors for the telecom range and beyond. |
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ISSN: | 2378-0967 2378-0967 |
DOI: | 10.1063/1.4973537 |